المؤلفون: Young-jin Kim, Jae-wan Kim, Parkhomenko, V.N., Donghyun Baek, Jae-heon Lee, Eun-yung Sung, Ilku Nam, Byeong-ha Park

المصدر: 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International. :2504-2513 2006

Relation: 2006 IEEE International Solid State Circuits Conference

المؤلفون: Kun-Seok Lee, Eun-Yung Sung, In-Chul Hwang, Byeong-Ha Park

المصدر: Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. Solid-State Circuits Conference Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European. :181-184 2005

Relation: Proceedings of ESSCIRC 2005. 31st European Solid-State Circuits Conference

المؤلفون: Eun-Yung Sung, Kun-Seok Lee, Dong-Hyun Baek, Young-Jin Kim, Byeong-Ha Park

المصدر: 2005 IEEE Asian Solid-State Circuits Conference Asian Solid-State Circuits Conference, 2005. :193-196 Nov, 2005

Relation: 2005 IEEE Asian Solid-State Circuits Conference

المؤلفون: Iiku Nam, Eun-yung Sung, Young-Jin Kim, Jae-heon Lee, Donghyun Baek, Jae-Wan Kim, V.N. Parkhomenko, Byeong-Ha Park

المصدر: ISSCC

مصطلحات موضوعية: Engineering, Ultra high frequency, CMOS, business.industry, DVB-H, Bipolar junction transistor, Digital Video Broadcasting, Electrical engineering, Tuner, business, Sensitivity (electronics), Noise (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::90245223f9cfc16511dc714d25d234bf
https://doi.org/10.1109/isscc.2006.1696315

المؤلفون: Byeong-Ha Park, Kun-Seok Lee, Young-Jin Kim, Donghyun Baek, Eun-yung Sung

المصدر: 2005 IEEE Asian Solid-State Circuits Conference.

مصطلحات موضوعية: Physics, Frequency synthesizer, Phase-locked loop, Switching time, Voltage-controlled oscillator, Direct digital synthesizer, business.industry, Local oscillator, Phase noise, Electrical engineering, Electronic engineering, dBc, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::63651d7cbc82f54129fb1646c04a63f9
https://doi.org/10.1109/asscc.2005.251698