يعرض 1 - 10 نتائج من 101 نتيجة بحث عن '"Greek-cross"', وقت الاستعلام: 1.11s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-5 Mar, 2023

    Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

  2. 2
    مؤتمر

    المصدر: 2019 Systems of Signal Synchronization, Generating and Processing in Telecommunications (SYNCHROINFO) Signal Synchronization, Generating and Processing in Telecommunications (SYNCHROINFO), 2019 Systems of. :1-4 Jul, 2019

    Relation: 2019 Systems of Signal Synchronization, Generating and Processing in Telecommunications (SYNCHROINFO)

  3. 3
    مؤتمر

    المصدر: 2019 International Vacuum Electronics Conference (IVEC) Vacuum Electronics Conference (IVEC), 2019 International. :1-3 Apr, 2019

    Relation: 2019 International Vacuum Electronics Conference (IVEC)

  4. 4
    مؤتمر

    المصدر: 2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-4 Mar, 2017

    Relation: 2017 International Conference of Microelectronic Test Structures (ICMTS)

  5. 5
    مؤتمر

    المصدر: 2016 10th European Conference on Antennas and Propagation (EuCAP) Antennas and Propagation (EuCAP), 2016 10th European Conference on. :1-5 Apr, 2016

    Relation: 2016 10th European Conference on Antennas and Propagation (EuCAP)

  6. 6
    دورية أكاديمية

    المصدر: IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 57(6):1736-1739 Dec, 2015

  7. 7
    مؤتمر

    المؤلفون: Diaz, Elkin, Ramon, E., Carrabina, Jordi

    المصدر: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on. :167-172 Mar, 2013

    Relation: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)

  8. 8
    دورية أكاديمية

    المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 19(1):2-9 Feb, 2006

  9. 9
  10. 10
    كتاب إلكتروني

    المؤلفون: Noficzer, EszterAff3, Iványi, MiklósAff3, Iványi, M. MiklósAff3

    المساهمون: Petzek, Edward, editorAff1, Bancila, Radu, editorAff2

    المصدر: The Eight International Conference "Bridges in Danube Basin" : New Trends in Bridge Engineering and Efficient Solutions for Large and Medium Span Bridges. :475-484