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المؤلفون: Fumitaka Arai, Koji Hosono, Hiroshi Nakamura, Hisataka Meguro, K. Quader, T. Yarnamura, H. Hazama, K. Hatakeyama, Ken Takeuchi, Tamio Ikehashi, J.J. Chen, K. Imamiya, Koichi Kawai, Toshihiko Himeno, M. Saito, N. Arai, K. Conley, R. Shirota, Kazushige Kanda, Takuya Futatsuyama
المصدر: IEEE Journal of Solid-State Circuits. 37:1493-1501
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, business.industry, Computer science, Nand flash memory, Parallel computing, Flash memory, CMOS, Memory architecture, Cache, Electrical and Electronic Engineering, Page, business, Throughput (business), Computer hardware, Garbage collection
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المؤلفون: Hisataka Meguro, E. Sakagami, M. Sato, N. Arai, Y.Y. Araki, Eiji Kamiya, Kuniyoshi Yoshikawa, Hiroaki Tsunoda, S. Mori
المصدر: IEEE Transactions on Electron Devices. 43:47-53
مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, Oxide, Dielectric, Flash memory, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, Non-volatile memory, chemistry.chemical_compound, chemistry, law, Optoelectronics, Electrical and Electronic Engineering, EPROM, business, Scaling
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المؤلفون: Deepanshu Dutta, K. Owada, H. Tomiie, Toru Ishigaki, T. Watanabe, M. Nakamichi, Y. Suyama, H. Takeshita, Shinji Sato, G. Hemink, Hisataka Meguro, Akihiro Kajita, Chun-Hung Lai, Yoshiaki Takeuchi, C. Chen, Guirong Liang, Fumitaka Arai, R. Shoji, Takuya Futatsuyama, Masaaki Higashitani, Jeffrey W. Lutze, Takahiko Hara, Hiroyuki Nitta, K. Ueno, T. Maruyama, Itaru Kawabata, Masato Endo, Y. Liu, Atsuhiro Sato, Takeshi Murata, Takeshi Kamigaichi, T. Izumi, Y. Dong, Ken Uchida, N. Nishihara, Y. Joko, S. Watanabe, Y. Ozawa, Y. Kanemaru, H. Takekida
المصدر: 2009 IEEE International Reliability Physics Symposium.
مصطلحات موضوعية: Space technology, Hardware_MEMORYSTRUCTURES, business.industry, Computer science, Electrical engineering, Flash memory, Non-volatile memory, Reliability (semiconductor), Nanoelectronics, Logic gate, Charge trap flash, Electronic engineering, Data retention, business, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::897289e59270c1f662d905157256444a
https://doi.org/10.1109/irps.2009.5173269 -
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المؤلفون: Fumitaka Arai, Akihiro Kajita, Hisataka Meguro, C. Chen, Ken Oowada, R. Shoji, Atsuhiro Sato, Toru Ishigaki, Itaru Kawabata, Y. Joko, T. Izumi, Y. Liu, Deepanshu Dutta, Y. Dong, Yoshio Ozawa, Jeffrey W. Lutze, T. Maruyama, Shigeyoshi Watanabe, K. Ueno, T. Watanabe, Ken Uchida, Takeshi Murata, H. Tomiie, Masato Endo, H. Nitsuta, Shinji Sato, H. Takekida, Y. Kanamaru, Takeshi Kamigaichi, G. Hemink, Guirong Liang, H. Takeshita, Masaaki Higashitani, M. Nakamichi, Y. Suyama, Chun-Hung Lai, K. Nishihara
المصدر: 2008 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Non-volatile memory, Hardware_MEMORYSTRUCTURES, Nanoelectronics, business.industry, Computer science, Nand flash memory, Logic gate, Electrical engineering, Electronic engineering, Data retention, business, Flash memory, Threshold voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9e9f4a4d77d1d7acb5602c1aee58d232
https://doi.org/10.1109/iedm.2008.4796825 -
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المؤلفون: Toshihiko Himeno, Tamio Ikehashi, Kazushige Kanda, M. Saito, Khandker N. Quader, Ken Takeuchi, N. Arai, Hisataka Meguro, H. Hazama, Hiroshi Nakamura, Koji Hosono, K. Hatakeyama, Toshio Yamamura, K. Conley, Jian Chen, K. Imamiya, Takuya Futatsuyama, R. Shirota, Fumitaka Arai, Koichi Kawai
المصدر: 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315).
مصطلحات موضوعية: Computer science, Nand flash memory, business.industry, Embedded system, business, Throughput (business), Decoding methods, Computer hardware, Flash memory, Voltage, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2c8a782d1f626d24e9b2a000bd06a3dc
https://doi.org/10.1109/isscc.2002.992123 -
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المؤلفون: Masayuki Ichige, Atsuhiro Sato, Masaaki Higashitani, M. Momodomi, Hisataka Meguro, Shigeki Takahashi, H. Iizuka, Tadashi Iguchi, R. Shirota, N. Arai, T. Miwa, Takeshi Kamigaichi, N. Kawai, S. Miyazaki, S. Tamon, T. Minami, Michiharu Matsui, Tuan Pham, Yoshiaki Takeuchi, G. Hemink, H. Kamata, Y. Ishibashi, Kikuko Sugimae, Hiroyuki Kutsukake, S. Mori, Masanobu Saito
المصدر: 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Nand flash memory, Transistor, NAND gate, law.invention, Flash (photography), law, Gigabit, Shallow trench isolation, Charge trap flash, Electronic engineering, Optoelectronics, Node (circuits), business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1a39d948fdea82af3af180691174d3b3
https://doi.org/10.1109/vlsit.2003.1221100 -
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المؤلفون: Tamio Ikehashi, Hisataka Meguro, Ken Takeuchi, Toshihiko Himeno, Hiroshi Nakamura, K. Conley, K. Quader, R. Shirota, Fumitaka Arai, K. Imamiya, Kazushige Kanda, K. Hatakeyama, Toshio Yamamura, Koichi Kawai, M. Saito, N. Arai, Takuya Futatsuyama, Jian Chen, Koji Hosono, H. Hazama
المصدر: 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315).
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Computer science, Nand flash memory, business.industry, NAND gate, Hardware_PERFORMANCEANDRELIABILITY, Flash (photography), CMOS, Embedded system, Memory architecture, Hardware_INTEGRATEDCIRCUITS, business, Throughput (business), Garbage collection
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::aefad271df3fd037d166e37c95bdc29f
https://doi.org/10.1109/isscc.2002.992961 -
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المؤلفون: K. Hatakeyama, Yuji Takeuchi, N. Kai, S. Satoh, Akira Shimizu, Hisataka Meguro, T. Hirose, Kazuhiro Shimizu, H. Kamata, Wakako Moriyama, K. Kugimiya, N. Ohtami, S. Miyazaki, Yoshiyuki Matsunaga, N. Arai, Fumitaka Arai, R. Shirota, Shigeki Takahashi, Toshitake Yaegashi, Eiji Kamiya
المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Programmable metallization cell, NAND gate, Integrated circuit design, Mass storage, Flash (photography), Gigabit, Charge trap flash, Electronic engineering, Optoelectronics, business, Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::03c0a36c323c06057908e898dd9efbe2
https://doi.org/10.1109/iedm.2000.904432