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1
المؤلفون: P. Gerard, C. Maurel, J. Beauvillain, Roland Coratger, F. Ajustron
المصدر: Journal of Applied Physics. 94:1979-1982
مصطلحات موضوعية: Materials science, business.industry, Scanning tunneling spectroscopy, General Physics and Astronomy, Spin polarized scanning tunneling microscopy, Conductive atomic force microscopy, Electrochemical scanning tunneling microscope, law.invention, Optics, Semiconductor, law, Optoelectronics, Light emission, Scanning tunneling microscope, business, Quantum tunnelling
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2
المؤلفون: Jean-Marc Bonard, L. Forró, A. Carladous, Jean-Paul Salvetat, J. Beauvillain, F. Ajustron, Roland Coratger
المصدر: The European Physical Journal Applied Physics. 15:177-180
مصطلحات موضوعية: Materials science, chemistry.chemical_element, Carbon nanotube, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Optical properties of carbon nanotubes, Condensed Matter::Materials Science, Field electron emission, chemistry, law, Light emission, Atomic physics, Scanning tunneling microscope, Luminescence, Spectroscopy, Instrumentation, Carbon
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::46f6b3b304a33a20df0e3e0c4397e46c
https://doi.org/10.1051/epjap:2001180 -
3
المؤلفون: I. Zorkani, Adil Chahboun, Roland Coratger, A. Pascale, F. Ajustron, J. Beauvillain, P. Baules
المصدر: Journal of Applied Physics. 89:6302-6307
مصطلحات موضوعية: Materials science, Silicon, chemistry, Transition metal, Electron injection, Microscopy, General Physics and Astronomy, chemistry.chemical_element, Gold surface, Atomic physics, Reflectivity, Semimetal, Ballistic electron emission microscopy
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4
المؤلفون: F. Ajustron, G. Seine, Roland Coratger, R. Pechou, A. Carladous, J. Beauvillain
المساهمون: Centre d'élaboration de matériaux et d'études structurales (CEMES), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut de Chimie de Toulouse (ICT), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie de Toulouse (ICT-FR 2599), Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Institut de Chimie du CNRS (INC)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Institut de Chimie du CNRS (INC)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)
المصدر: Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2000, 465 (3), pp.219-226. ⟨10.1016/S0039-6028(00)00676-2⟩
Surface Science
Surface Science, Elsevier, 2000, 465 (3), pp.219-226. ⟨10.1016/S0039-6028(00)00676-2⟩مصطلحات موضوعية: Distance-voltage characteristics, Scanning tunneling spectroscopy, Polycrystalline materials, Imaging techniques, Scanning capacitance microscopy, Work function, 01 natural sciences, law.invention, Condensed Matter::Materials Science, Scanning probe microscopy, Optics, law, 0103 physical sciences, Materials Chemistry, Scanning tunneling microscopy, 010306 general physics, [PHYS]Physics [physics], 010302 applied physics, business.industry, Chemistry, Spin polarized scanning tunneling microscopy, Surfaces and Interfaces, Conductive atomic force microscopy, Condensed Matter Physics, Deformation, Electrochemical scanning tunneling microscope, Surfaces, Coatings and Films, Electric potential, Surface phenomena, Graphite, Gold, Scanning tunneling microscope, business, Surface reconstruction, Crystal orientation
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5
المؤلفون: Anura Priyajith Samantilleke, J. Beauvillain, Adil Chahboun, F. Ajustron, Roland Coratger, I. M. Dharmadasa
المصدر: Scopus-Elsevier
CIÊNCIAVITAEمصطلحات موضوعية: Impact ionization, Local density of states, Semiconductor, Chemistry, business.industry, General Physics and Astronomy, High voltage, Atomic physics, Spectroscopy, business, Spectral line, Ballistic electron emission microscopy, Voltage
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المؤلفون: A. Carladous, R. Pechou, F. Ajustron, J. Beauvillain, G. Seine, Roland Coratger
المساهمون: Centre d'élaboration de matériaux et d'études structurales (CEMES), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie de Toulouse (ICT-FR 2599), Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Institut de Chimie du CNRS (INC)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Institut de Chimie du CNRS (INC)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut de Chimie de Toulouse (ICT), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)
المصدر: Physical Review B: Condensed Matter and Materials Physics (1998-2015)
Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 1999, 60 (15), pp.11045-11050. ⟨10.1103/PhysRevB.60.11045⟩
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 1999, 60 (15), pp.11045-11050. ⟨10.1103/PhysRevB.60.11045⟩مصطلحات موضوعية: [PHYS]Physics [physics], Materials science, Condensed matter physics, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, Surface distance, Optics, law, 0103 physical sciences, Electrode, Gold surface, Scanning tunneling microscope, 010306 general physics, 0210 nano-technology, business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::696759b4f6616219c6b31350612293de
https://doi.org/10.1103/physrevb.60.11045 -
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المؤلفون: J. Beauvillain, F. Ajustron, G. Seine, A. Carladous, Roland Coratger
المصدر: Journal of Applied Physics. 84:1085-1089
مصطلحات موضوعية: Materials science, business.industry, Astrophysics::High Energy Astrophysical Phenomena, Scanning tunneling spectroscopy, General Physics and Astronomy, Biasing, Spin polarized scanning tunneling microscopy, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, law.invention, Condensed Matter::Materials Science, Semiconductor, law, Excited state, Emission spectrum, Atomic physics, Scanning tunneling microscope, business, Astrophysics::Galaxy Astrophysics, Quantum tunnelling
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المؤلفون: I. M. Dharmadasa, C.J. Blomfield, F. Ajustron, J. Beauvillain, C.G. Scott, Roland Coratger
المصدر: Solid-State Electronics. 42:595-604
مصطلحات موضوعية: Photoluminescence, Materials science, Deep-level transient spectroscopy, Condensed matter physics, Band gap, Electron, Condensed Matter Physics, Electrical contacts, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Metal, visual_art, Materials Chemistry, visual_art.visual_art_medium, Electrical and Electronic Engineering, Atomic physics, Ballistic electron emission microscopy
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9
المؤلفون: A. Bessieres, Martine Meireles, Roland Coratger, Victor Sanchez, J. Beauvillain
المصدر: Journal of Membrane Science. 109:271-284
مصطلحات موضوعية: Microscope, Chemistry, Microfiltration, Analytical chemistry, Ultrafiltration, Filtration and Separation, Biochemistry, law.invention, Membrane technology, Membrane, Chemical engineering, law, Surface roughness, General Materials Science, Near-field scanning optical microscope, Physical and Theoretical Chemistry, Scanning tunneling microscope
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المؤلفون: Kevin Alan Prior, B. C. Cavenett, I. M. Dharmadasa, E. Ajustron, Roland Coratger, C.J. Blomfield, J. Simpson, J. Beauvillain
المصدر: Materials Science and Technology. 12:86-89
مصطلحات موضوعية: Materials science, Mechanical Engineering, Schottky barrier, Analytical chemistry, Condensed Matter Physics, Isotropic etching, Electrical contacts, Vacuum evaporation, Metal, X-ray photoelectron spectroscopy, Mechanics of Materials, visual_art, visual_art.visual_art_medium, General Materials Science, Thin film, Stoichiometry