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المؤلفون: Magali Lamy, Marc de la Bardonnie, Frederic Lorut, Ryan Ross, Christophe Wyon, Laurens F. Tz. Kwakman
المصدر: EDFA Technical Articles. 8:14-20
مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b66b82bfa4bc580f924d68450c8bab8c
https://doi.org/10.31399/asm.edfa.2006-2.p014 -
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المؤلفون: Marc Sentis, Jens Beyersdorfer, Laurens F. Tz. Kwakman, Jan Schischka, Falk Naumann, Marcus Straw, Frank Altmann, Gaëlle Coustillier
المصدر: Scopus-Elsevier
مصطلحات موضوعية: Materials science, business.industry, Sample preparation, Process engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5079e119b0f25fbcf866c17036904c04
https://doi.org/10.31399/asm.cp.istfa2013p0017 -
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المؤلفون: Vinh Van Ngo, Frank Altmann, Ralf Lehmann, Stacey Stone, Jan Schischka, Laurens F. Tz. Kwakman
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Materials science, business.industry, Electron beam-induced current, Optoelectronics, Thin film solar cell, business, Focused ion beam, Characterization (materials science)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c98c889b13c586bd299384b1907d7dba
https://doi.org/10.31399/asm.cp.istfa2010p0151