المؤلفون: Lin, Y.L., Liu, Y. R., Kao, T. C., Lee, M. Y., Guo, J. C., Hou, T. -H., Chung, Steve S.

المصدر: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) Technology, Systems and Applications (VLSI TSA), 2024 International VLSI Symposium on. :1-2 Apr, 2024

Relation: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)

المؤلفون: Huang, M., Lin, Y.L., Ou, J., Zhang, X.y., Lin, Q.W., Che, W., Xue, Q.

المصدر: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 67(5):1974-1984 May, 2019

المؤلفون: Lin, Y.L., Chen, S.T., Zheng, N.Y., Wang, H.C.

المصدر: In Energy 1 September 2023 278 Part B

المؤلفون: Lin, M.H., Lin, Y.L., Yang, G.S., Yeh, M.-S., Chang, K.P., Su, K.C., Tahui Wang

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :177-180 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Lin, M.H., Lin, Y.L., Chen, J.M., Tsai, C.C., Yeh, M.-S., Liu, C.C., Hsu, S., Wang, C.H., Sheng, Y.C., Chang, K.P., Su, K.C., Chang, Y.J., Tahui Wang

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :229-233 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Lin, M.H., Yang, G.S., Lin, Y.L., Lin, M.T., Lin, C.C., Yeh, M.S., Chang, K.P., Su, K.C., Chen, J.K., Chang, Y.J., Tahui Wang

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :50-54 2002

Relation: IEEE International Integrated Reliability Workshop

المؤلفون: Lin, Y.L., Tsai, J., Kao, C.R.

المصدر: Proceedings of the 4th International Symposium on Electronic Materials and Packaging, 2002. Electronic materials and packaging Electronic Materials and Packaging, 2002. Proceedings of the 4th International Symposium on. :324-329 2002

Relation: Proceedings of the 4th International Symposium on Electronic Materials and Packaging

المؤلفون: Lin, Y.L., Zhang, X.Y., Du, Z., Lin, Q.W.

المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 65(7):819-823 Jul, 2018

المؤلفون: Lin, Y.L., Witulski, A.F.

المصدر: Proceedings of APEC 97 - Applied Power Electronics Conference Applied power electronics Applied Power Electronics Conference and Exposition, 1997. APEC '97 Conference Proceedings 1997., Twelfth Annual. 2:776-782 vol.2 1997

Relation: Proceedings of APEC 97 - Applied Power Electronics Conference

المؤلفون: Lin, Y.L., Witulski, A.F.

المصدر: Proceedings of APEC 97 - Applied Power Electronics Conference Applied power electronics Applied Power Electronics Conference and Exposition, 1997. APEC '97 Conference Proceedings 1997., Twelfth Annual. 2:1008-1013 vol.2 1997

Relation: Proceedings of APEC 97 - Applied Power Electronics Conference