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1دورية أكاديمية
المؤلفون: Rathaur, S.K., Ma, C., Dixit, A., Lee, C., Chang, E.Y.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(3):428-436 Sep, 2024
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2مؤتمر
المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :1-3 Jun, 2024
Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
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3دورية أكاديمية
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):2914-2919 May, 2024
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4دورية أكاديمية
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):2920-2924 May, 2024
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8مؤتمر
المؤلفون: Tan, Junzhe, Yang, Dongyi, Wu, Shiqiang, Zhu, Yuhao, Pan, Yaoyao, Cui, Pengju, Liu, Wen
المصدر: 2023 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2023 International Conference on. :52-56 Sep, 2023
Relation: 2023 International Conference on IC Design and Technology (ICICDT)
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9مؤتمر
المؤلفون: Wu, Pei-Yu, Tsai, Xin-Ying, Chang, Ting-Chang, Tsai, Tsung-Ming, Sze, Simon M.
المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-4 Mar, 2023
Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)
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10دورية أكاديمية
المؤلفون: Arias-Purdue, A., Rowell, P.V., King, C.M., Carter, A.D., Paniagua, A., Shinohara, K., Bergman, J., Urteaga, M.E., Miller, N.C., Elliott, M., Gilbert, R., Herrault, F., Green, D., Buckwalter, J.F.
المصدر: IEEE Microwave and Wireless Technology Letters IEEE Microw. Wireless Tech. Lett. Microwave and Wireless Technology Letters, IEEE. 33(7):1011-1014 Jul, 2023