يعرض 1 - 10 نتائج من 86 نتيجة بحث عن '"Ota, Kensuke"', وقت الاستعلام: 0.80s تنقيح النتائج
  1. 1
    مؤتمر
    Novel Operation Scheme for Suppressing Disturb in HfO2-based FeFET Considering Charge- Trapping-Coupled Polarization Dynamics

    المؤلفون: Hamai, Takamasa, Suzuki, Kunifumi, Ichihara, Reika, Higashi, Yusuke, Yoshimura, Yoko, Sakuma, Kiwamu, Ota, Kensuke, Takahashi, Kota, Matsuo, Kazuhiro, Fujii, Shosuke, Saitoh, Masumi

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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  2. 2
    مؤتمر
    Toward 7 Bits per Cell: Synergistic Improvement of 3D Flash Memory by Combination of Single-crystal Channel and Cryogenic Operation

    المؤلفون: Tanaka, Hitomi, Aiba, Yuta, Maeda, Takashi, Ota, Kensuke, Higashi, Yusuke, Sawa, Keiichi, Kikushima, Fumie, Miura, Masayuki, Sanuki, Tomoya

    المصدر: 2022 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2022 IEEE International. :1-4 May, 2022

    Relation: 2022 IEEE International Memory Workshop (IMW)

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  3. 3
    مؤتمر
    Breakdown Lifetime Analysis of HfO2-based Ferroelectric Tunnel Junction (FTJ) Memory for In-Memory Reinforcement Learning

    المؤلفون: Yamaguchi, Marina, Fujii, Shosuke, Ota, Kensuke, Saitoh, Masumi

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    Emerging Non-Volatile Memory and Thin-Film Transistor Technologies for Future 3D-LSI

    المؤلفون: Saitoh, Masumi, Fujii, Shosuke, Oda, Minoru, Yamaguchi, Marina, Kabuyanagi, Shoichi, Yoshimura, Yoko, Ota, Kensuke, Sakuma, Kiwamu, Kamimuta, Yuuichi

    المصدر: 2018 48th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2018 48th European. :138-141 Sep, 2018

    Relation: ESSDERC 2018 - 48th European Solid-State Device Research Conference (ESSDERC)

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  5. 5
    مؤتمر
    Random Telegraph Noise after Hot Carrier Injection in Tri-gate Nanowire Transistor

    المؤلفون: Ota, Kensuke, Ichihara, Reika, Suzuki, Masamichi, Saitoh, Masumi, Mitani, Yuichiro

    المصدر: 2019 Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2019. :169-171 Mar, 2019

    Relation: 2019 Electron Devices Technology and Manufacturing Conference (EDTM)

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  6. 6
    مؤتمر
    Improved State Stability of HfO2 Ferroelectric Tunnel Junction by Template-Induced Crystallization and Remote Scavenging for Efficient in-Memory Reinforcement Learning

    المؤلفون: Fujii, Shosuke, Yamaguchi, Marina, Kabuyanagi, Shoichi, Ota, Kensuke, Saitoh, Masumi

    المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

    Relation: 2020 IEEE Symposium on VLSI Technology

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  7. 7
    مؤتمر
    HfO2-based FeFET and FTJ for Ferroelectric-Memory Centric 3D LSI towards Low-Power and High-Density Storage and AI Applications

    المؤلفون: Saitoh, Masumi, Ichihara, Reika, Yamaguchi, Marina, Suzuki, Kunifumi, Takano, Keisuke, Akari, Keisuke, Takahashi, Kota, Kamiya, Yuta, Matsuo, Kazuhiro, Kamimuta, Yuuichi, Sakuma, Kiwamu, Ota, Kensuke, Fujii, Shosuke

    المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :18.1.1-18.1.4 Dec, 2020

    Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

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  8. 8
    مؤتمر
    In-memory Reinforcement Learning with Moderately-Stochastic Conductance Switching of Ferroelectric Tunnel Junctions

    المؤلفون: Berdan, Radu, Marukame, Takao, Kabuyanagi, Shoichi, Ota, Kensuke, Saitoh, Masumi, Fujii, Shosuke, Deguchi, Jun, Nishi, Yoshifumi

    المصدر: 2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T22-T23 Jun, 2019

    Relation: 2019 Symposium on VLSI Technology

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  9. 9
    مؤتمر
    BSIM4 parameter extraction for tri-gate Si nanowire transistors

    المؤلفون: Tanaka, Chika, Saitoh, Masumi, Ota, Kensuke, Numata, Toshinori

    المصدر: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on. :151-154 Mar, 2013

    Relation: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)

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  10. 10
    مؤتمر
    Minimum Classification Error training employing Real-Coded Genetic Algorithms

    المؤلفون: Ota, Kensuke, Katagiri, Shigeru, Ohsaki, Miho

    المصدر: TENCON 2012 IEEE Region 10 Conference TENCON 2012 - 2012 IEEE Region 10 Conference. :1-6 Nov, 2012

    Relation: TENCON 2012 - 2012 IEEE Region 10 Conference

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