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1
المؤلفون: Hungyu Lin, Ethan Wang, Jason Sweis, Philippe Hurat, Ya-Chieh Lai, Pai Yu-Chin, Ku Fang, Ching Juan Lee, Chia Wei Huang, Jun-Ming Chen, Yung-Feng Cheng
المصدر: Metrology, Inspection, and Process Control XXXVI.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::83612338b32e5cfd4ec4088e975113a9
https://doi.org/10.1117/12.2613620 -
2دورية
المؤلفون: Robinson, John C., Sendelbach, Matthew J., Lin, Hung-yu, Wang, Ethan, Sweis, Jason, Hurat, Philippe, Lai, Ya-Chieh, Pai, Yu-Chin, Fang, Ku, Li, Chin-Juan, Huang, Chia Wei, Chen, Jun-Ming, Cheng, Yung-Feng
المصدر: Proceedings of SPIE; May 2022, Vol. 12053 Issue: 1 p120531T-120531T-5, 1084785p
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3مؤتمر
المؤلفون: Lin, Hung-yu, Wang, Ethan, Sweis, Jason, Hurat, Philippe, Lai, Ya-Chieh, Pai, Yu-Chin, Fang, Ku, Li, Chin-Juan, Huang, Chia Wei, Chen, Jun-Ming, Cheng, Yung-Feng
المصدر: Proceedings of SPIE; 1/20/2022, Vol. 12053, p120531T-120531T-5, 1p