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1
المؤلفون: Tresa M. Pollock, McLean P. Echlin, Aurelien Botman, Remco Geurts, Steven Randolph, James Lamb, Andrew T. Polonsky
المصدر: JOM. 73:4258-4269
مصطلحات موضوعية: Materials science, law, business.industry, Femtosecond, General Engineering, Optoelectronics, General Materials Science, Laser, business, law.invention
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2
المؤلفون: Remco Geurts
المصدر: Microscopy and Microanalysis. 28:874-875
مصطلحات موضوعية: Instrumentation
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3
المؤلفون: James Lamb, McLean Echlin, Andrew Polonsky, Remco Geurts, Kira Pusch, Evan Raeker, Aurelien Botman, Chris Torbet, Tresa Pollock
المصدر: Microscopy and Microanalysis. 28:862-863
مصطلحات موضوعية: Instrumentation
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4
المؤلفون: Alistair Garner, Jack Donoghue, Remco Geurts, Yasser Al Aboura, Bartłomiej Winiarski, Phil B. Prangnell, Tim L. Burnett
المصدر: Burnett, T, Garner, A, Donoghue, J, Al Aboura, Y, Prangnell, P & Winiarski, B 2022, ' Large-scale serial sectioning of environmentally assisted cracks in 7xxx Al alloys using femtosecond Laser-PFIB ', Materials Characterization . https://doi.org/10.1016/j.matchar.2022.111890
مصطلحات موضوعية: Mechanics of Materials, Mechanical Engineering, General Materials Science, Condensed Matter Physics
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5
المؤلفون: Raphaela Scharfschwerdt, Remco Geurts, Huikai Cheng, Robert Imlau, Letian Li, Brandon Van Leer
المصدر: Microscopy Today. 26:18-25
مصطلحات موضوعية: 010302 applied physics, General Computer Science, Computer science, Scanning electron microscope, Process (computing), Nanotechnology, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Focused ion beam, Transparency (projection), Workflow, Transmission electron microscopy, 0103 physical sciences, Sample preparation, 0210 nano-technology, Tem analysis
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المؤلفون: Andrew T. Polonsky, Steven Randolph, McLean P. Echlin, Jorge Filevich, Marcus Straw, Chris J. Torbet, Michael S. Titus, Tresa M. Pollock, Aurelien Botman, Alessandro Mottura, W. C. Lenthe, Remco Geurts, Toby Francis
المصدر: Microscopy and Microanalysis. 26:2624-2625
مصطلحات موضوعية: Data acquisition, Materials science, business.industry, Computer vision, Artificial intelligence, Tomography, business, Instrumentation
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7
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المؤلفون: Grace Burke, G. Bertali, Timothy L. Burnett, Robert S. Bradley, Sarah J. Haigh, Remco Geurts, Philip J. Withers, Thomas J. A. Slater
مصطلحات موضوعية: Correlative, Materials science, Creep, Cavitation, Metallurgy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3b632a60fa3d051bb8efb6343aec2dda
https://doi.org/10.1002/9783527808465.emc2016.5929 -
9
المؤلفون: Debbie J. Stokes, Asa H. Barber, Frank de Jong, Remco Geurts, Russell J. Bailey
المصدر: Micron. 50:51-56
مصطلحات موضوعية: chemistry.chemical_classification, Materials science, Energy-dispersive X-ray spectroscopy, General Physics and Astronomy, Nanotechnology, Cell Biology, Polymer, Focused ion beam, Ion, chemistry, Structural Biology, visual_art, Microscopy, visual_art.visual_art_medium, General Materials Science, Composite material, Polycarbonate, Elastic modulus, Beam (structure)
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10
المؤلفون: Debbie J. Stokes, Asa H. Barber, Frank de Jong, Remco Geurts, Russell J. Bailey
المصدر: MRS Proceedings. 1421
مصطلحات موضوعية: Scanning probe microscopy, chemistry.chemical_compound, Materials science, Nanocomposite, chemistry, Polymer nanocomposite, Phase (matter), Microscopy, Scanning ion-conductance microscopy, Nanotechnology, Focused ion beam, AFm phase