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1مؤتمر
المؤلفون: Chen, Bohan, Song, Chengxin, Lin, Boyu, Xu, Xin, Tang, Ruoyan, Lin, Yunxuan, Yao, Yuan, Timoney, Joseph, Bi, Ting
المصدر: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2022 IEEE International Conference on. :145-150 Oct, 2022
Relation: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)