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1دورية أكاديمية
المؤلفون: Ukjin Jung, Yun Ji Kim, Kim, Y., Lee, Y.G., Lee, B.H.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 36(4):408-410 Apr, 2015
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المؤلفون: Seongkyung Kim, Ukjin Jung, Seungjin Choo, Kihyun Choi, Taejin Chung, Shinyoung Chung, Euncheol Lee, Juhun Park, Deokhan Bae, Myungyoon Um
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::47ddeece160bc76ece9e1977aba23942
https://doi.org/10.1109/irps48227.2022.9764599 -
3
المؤلفون: Byoung Hun Lee, Seung Mo Kim, Soo Cheol Kang, Woojin Park, Yonghun Kim, Ukjin Jung
المصدر: Solid-State Electronics. 158:46-50
مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, Transistor, 02 engineering and technology, Dielectric, Electron, Trapping, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), Stack (abstract data type), law, 0103 physical sciences, Materials Chemistry, Relaxation (physics), Electrical and Electronic Engineering, 0210 nano-technology, High-κ dielectric
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4
المؤلفون: Sangchul Lee, Chunhum Cho, Ukjin Jung, Byoung Hun Lee, Sang Kyung Lee, Chang Goo Kang, Young Gon Lee
المصدر: Carbon. 93:286-294
مصطلحات موضوعية: Work (thermodynamics), Materials science, Graphene, Transistor, Nanotechnology, General Chemistry, Substrate (electronics), law.invention, Hysteresis, Quality (physics), law, Molecule, General Materials Science, Graphene nanoribbons
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5
المؤلفون: Sang-chul Shin, Jinju Kim, Hyunchul Sagong, Minhyuck Choi, Ukjin Jung, Sangwoo Pae, Hyun-Jin Kim, Minjung Jin, Junekyun Park
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Materials science, Gate oxide, business.industry, 0103 physical sciences, Gate dielectric, Optoelectronics, Time-dependent gate oxide breakdown, SILC, business, 01 natural sciences
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2e9ad79cf416735443e8d350cacd726e
https://doi.org/10.1109/irps.2018.8353577 -
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المؤلفون: Yun Ji Kim, Soyoung Kim, Ukjin Jung, Byoung Hun Lee
المصدر: Scientific Reports
Scientific Reports, Vol 8, Iss 1, Pp 1-7 (2018)مصطلحات موضوعية: Materials science, Silicon, chemistry.chemical_element, lcsh:Medicine, 02 engineering and technology, Dielectric, 01 natural sciences, Oxygen, Article, law.invention, law, 0103 physical sciences, Work function, Metal gate, lcsh:Science, High-κ dielectric, 010302 applied physics, Multidisciplinary, Condensed matter physics, Graphene, lcsh:R, 021001 nanoscience & nanotechnology, chemistry, Fermi level pinning, lcsh:Q, 0210 nano-technology
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7
المؤلفون: Ukjin Jung, Young Gon Lee, James Walter Blatchford, Brian K. Kirkpatrick, Hiroaki Niimi, Younggy Kim, Seung-Chul Song, Jin Ju Kim, Byoung Hun Lee
المصدر: Microelectronic Engineering. 142:1-6
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Polysilicon depletion effect, Gate dielectric, Time-dependent gate oxide breakdown, Equivalent oxide thickness, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, Capacitance, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Hardware_GENERAL, Gate oxide, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Electrical and Electronic Engineering, business, Metal gate, Hardware_LOGICDESIGN, Leakage (electronics)
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8
المؤلفون: Byoung Hun Lee, Jongwoo Park, Young Gon Lee, Jin Ju Kim, Kyong Taek Lee, Yonghun Kim, Minhyeok Choe, Ukjin Jung, Sangwoo Pae
المصدر: IEEE Transactions on Electron Devices. 62:1092-1097
مصطلحات موضوعية: Materials science, Gate oxide, Gate dielectric, MOSFET, Extraction (chemistry), Analytical chemistry, Time domain, Electrical and Electronic Engineering, Reflectometry, Capacitance, Electronic, Optical and Magnetic Materials, High-κ dielectric
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9
المؤلفون: Soo Cheol Kang, Yonghun Kim, Seung Mo Kim, Byoung Hun Lee, Ukjin Jung, Sang Kyung Lee
المصدر: IEEE Electron Device Letters. 37:366-368
مصطلحات موضوعية: 010302 applied physics, Materials science, Infrasound, 02 engineering and technology, Mechanics, 021001 nanoscience & nanotechnology, 01 natural sciences, Instability, Pseudorandom binary sequence, Electronic, Optical and Magnetic Materials, Stress (mechanics), Logic gate, 0103 physical sciences, Electronic engineering, Electrical and Electronic Engineering, 0210 nano-technology, Random logic, Jitter, Degradation (telecommunications)
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المؤلفون: Taiki Uemura, Jungin Kim, Jinju Kim, Hyun Chul Sagong, Gunrae Kim, Ukjin Jung, Changze Liu, Sangwoo Pae, Sang-chul Shin, Junekyun Park, Minjung Jin
المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Engineering, Variation (linguistics), business.industry, 0103 physical sciences, Electronic engineering, Node (circuits), Static random-access memory, business, 01 natural sciences, Reliability (statistics), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9895eb26a05ceb92006dad815918217e
https://doi.org/10.1109/irps.2017.7936416