المؤلفون: Han, X., Ren, L. Z., Xu, X., Ying, L., Wu, C. W., Hou, W. B.^{Aff3, Aff4, IDs11340024010937_cor6}

المصدر: Experimental Mechanics: An International Journal Integrating Experimental Methods with the Mechanical Behavior of Materials and Structures. :1-13

المؤلفون: Wu, C-W., Biggar, K.K., Storey, K.B.

المصدر: Brazilian Journal of Medical and Biological Research. January 2013 46(1)

مصطلحات موضوعية: Metabolic depression, T2DM, PPAR-γ, MicroRNA, Glucose transport, Akt

وصف الملف: text/html

URL الوصول: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0100-879X2013000100001

المؤلفون: Yeap, Geoffrey, Lin, S. S., Chen, Y. M., Shang, H. L., Wang, P. W., Lin, H. C., Peng, Y. C., Sheu, J. Y., Wang, M., Chen, X., Yang, B. R., Lin, C. P., Yang, F. C., Leung, Y. K., Lin, D. W., Chen, C. P., Yu, K. F., Chen, D. H., Chang, C. Y., Chen, H. K., Hung, P., Hou, C. S., Cheng, Y. K., Chang, J., Yuan, L., Lin, C. K., Chen, C. C., Yeo, Y. C., Tsai, M. H., Lin, H. T., Chui, C. O., Huang, K. B., Chang, W., Lin, H. J., Chen, K. W., Chen, R., Sun, S. H., Fu, Q., Yang, H. T., Chiang, H. T., Yeh, C. C., Lee, T. L., Wang, C. H., Shue, S. L., Wu, C. W., Lu, R., Lin, W. R., Wu, J., Lai, F., Wu, Y. H., Tien, B. Z., Huang, Y. C., Lu, L. C., He, Jun, Ku, Y., Lin, J., Cao, M., Chang, T. S., Jang, S. M.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :36.7.1-36.7.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Wu, C. -W.

مصطلحات موضوعية: Physics - Popular Physics

URL الوصول: http://arxiv.org/abs/1801.02975

المؤلفون: Humeau-Heurtier, A., Wu, C.-W., Wu, S.-D.

المصدر: IEEE Signal Processing Letters IEEE Signal Process. Lett. Signal Processing Letters, IEEE. 22(12):2364-2367 Dec, 2015

المؤلفون: Liu, H., Cao, M., Wu, C. W., Lu, J.-A., Tse, C. K.

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 62(4):1185-1194 Apr, 2015

المؤلفون: Shih, H.-C., Wu, C.-W.

المصدر: 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013. :1486-1489 Mar, 2013

Relation: 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE 2013)

المؤلفون: Dong, D. L.^Aff2, Zhang, W.^Aff2, Ma, J. L.^Aff2, Wu, C. W.^Aff2

المساهمون: Wahab, Magd Abdel, editor^Aff1

المصدر: Proceedings of the 13th International Conference on Damage Assessment of Structures : DAMAS 2019, 9-10 July 2019, Porto, Portugal. :767-774

المؤلفون: Liu, H., Cao, M., Wu, C. W.

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 61(5):1520-1530 May, 2014

المؤلفون: Peng, Y.-L., Kwai, D.-M., Chou, Y.-F., Wu, C.-W.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 22(2):207-219 Feb, 2014