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1
المؤلفون: Tsung-Wei Lin, Hung-Yu Lin, Mang-Shiun Chiang, Yeh Shi-Cheng, Jason Sweis, Philippe Hurat, Tung Yu Wu, Chun-Sheng Wu, Chao-Yi Huang, Ya-Chieh Lai
المصدر: DTCO and Computational Patterning II.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::63a2390794795528d4dc69cce2eed1be
https://doi.org/10.1117/12.2657649 -
2
المؤلفون: Haoyu Yang, Shuhe Li, Wen Chen, Piyush Pathak, Frank Gennari, Ya-Chieh Lai, Bei Yu
المصدر: IEEE Transactions on Semiconductor Manufacturing. 35:67-77
مصطلحات موضوعية: Electrical and Electronic Engineering, Condensed Matter Physics, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials
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3
المؤلفون: Jonathan Fales, Binod Kumar G. Nair, Jeffrey E. Nelson, Frank E. Gennari, Philippe Hurat, Jac Condella, Akif Sultan, Aaron Sinnott, Xiaoyuan Qi, Sriram Madhavan, Uwe Paul Schroeder, Rwik Sengupta, Ya-Chieh Lai
المصدر: IEEE Transactions on Semiconductor Manufacturing. 34:372-378
مصطلحات موضوعية: Computer science, Process (engineering), Yield (finance), Semiconductor device modeling, Critical area, Integrated circuit, Condensed Matter Physics, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, Reliability engineering, law.invention, law, Range (statistics), Electrical and Electronic Engineering, Failure mode and effects analysis, Scaling
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4
المؤلفون: Tsung-Wei Lin, Chun Yen Liu, Hung-Yu Lin, Mang-Shiun Chiang, Jason Sweis, Chun Yen Liao, Chun-Sheng Wu, Chao-Yi Huang, Ya-Chieh Lai, Philippe Hurat
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dcb1952ea6978b9902e3b9fa2e0eac71
https://doi.org/10.1117/12.2612476 -
5
المؤلفون: Fadi Salameh Batarseh, Uwe Paul Schroeder, Jeff Nelson, Piyush Pathak, Wei-Long Wang, Ya-Chieh Lai
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8c39c51395aa20f214d9c1e1aabc2cfe
https://doi.org/10.1117/12.2617261 -
6
المؤلفون: Hungyu Lin, Ethan Wang, Jason Sweis, Philippe Hurat, Ya-Chieh Lai, Pai Yu-Chin, Ku Fang, Ching Juan Lee, Chia Wei Huang, Jun-Ming Chen, Yung-Feng Cheng
المصدر: Metrology, Inspection, and Process Control XXXVI.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::83612338b32e5cfd4ec4088e975113a9
https://doi.org/10.1117/12.2613620 -
7
المؤلفون: Piyush Pathak, Uwe Paul Schroeder, Fadi Batarseh, Philippe Hurat, Jeffrey E. Nelson, Sriram Madhavan, Ya-Chieh Lai
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Similarity (network science), Computer science, Metric (mathematics), Pattern matching, Semi-supervised learning, Approximate string matching, Physical design, Cluster analysis, Algorithm, Ranking (information retrieval)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40d43d18d5b04c9fb948289250bf8f06
https://doi.org/10.1117/12.2586112 -
8
المؤلفون: Philippe Hurat, Ya-Chieh Lai, Atul Chittora, Jeffrey E. Nelson, Xiaoyuan Qi, Rwik Sengupta, Binod Kumar G. Nair, Aaron Sinnott, Frank E. Gennari, Jac Condella, Jonathan Fales, Shobhit Malik
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Adaptive sampling, Computer science, law, Yield (finance), Transistor, Process (computing), Normalization (sociology), Critical area, Projection (set theory), Failure mode and effects analysis, Reliability engineering, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e31d2dd7cd19fd6f640897511ffa93f0
https://doi.org/10.1117/12.2583515 -
9
المؤلفون: Single Hsu, Brian Lee, Jansen Chee, Tamba Gbondo-Tugbawa, Ethan Wang, Ya-Chieh Lai, Eason Lin, Aaron Gower-Hall
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Back end of line, Interconnection, Hardware_MEMORYSTRUCTURES, Computer science, Chemical-mechanical planarization, Pooling, Process (computing), Copper interconnect, Early detection, Integrated circuit design, ComputerSystemsOrganization_PROCESSORARCHITECTURES, Computational science
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d21447ff09e2988bd3986fd3d34e4ad2
https://doi.org/10.1117/12.2551253 -
10
المؤلفون: Frank E. Gennari, Piyush Pathak, Ya-Chieh Lai, Sangah Lee, Jae-Hyun Kang, Jac Condella, Joong-Won Jeon, Jin Kim, Philippe Hurat, Jaehwan Kim, Shin Byung-Chul
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Set (abstract data type), Optical proximity correction, Computer science, Extreme ultraviolet lithography, Reliability (computer networking), Design pattern, Process (computing), Overhead (computing), Design for manufacturability, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c74af2a2e8bc634694fb1288e684fbd6
https://doi.org/10.1117/12.2551970