المؤلفون: Doong, K.Y.-Y., Sunnys Hsieh, Sheng-Che Lin, Binson Shen, Wang Chien-Jung, Yen-Hen Ho, Jye-Yen Cheng, Yeu-Haw Yang, Miyamoto, K., Hsu, C.C.-H.

المصدر: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) Microelectronic test structures Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on. :51-56 2000

Relation: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures

المؤلفون: Yeu-Haw Yang, Binson Shen, Che-Hsiung Hsu, Wang Chien-Jung, K. Miyamoto, Sheng-Che Lin, Yen-Hen Ho, Jye-Yen Cheng, Sunnys Hsieh, Kelvin Doong

المصدر: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).

مصطلحات موضوعية: Engineering, business.industry, Process (computing), System testing, Integrated circuit, Chip, law.invention, law, Control system, Electronic engineering, Process optimization, Defect tracking, business, Failure mode and effects analysis, Computer hardware

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0a76c993449fe3cdce429a4949963c8a
https://doi.org/10.1109/icmts.2000.844404

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