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1مؤتمر
المؤلفون: Guarino, L., Caglio, C., Villa, R., Zullino, L., Cecchetto, L.
المصدر: 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2022 23rd International Conference on. :1-6 Apr, 2022
Relation: 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
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2مؤتمر
المؤلفون: Annese, M., Montanini, P., Toia, F., Zullino, L., Contiero, C.
المصدر: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on. :1-4 2006
Relation: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (ISPSD)
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3مؤتمر
المؤلفون: Blaho, M., Pogany, D., Gornik, E., Zullino, L., Morena, E., Stella, R., Andreini, A.
المصدر: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :235-240 2003
Relation: International Reliability Physics Symposium
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4مؤتمر
المؤلفون: Reggiani, S., Valdinoci, A., Colalongo, L., Rudan, M., Baccarani, G., Stricker, A., Illien, F., Felber, N., Fichtner, W., Mettler, S., Lindenkreuz, S., Zullino, L.
المصدر: International Conference on Simulation of Semiconductor Processes and Devices Simulation of semiconductor processes Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on. :15-20 2002
Relation: 2002 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2002)
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5مؤتمر
المؤلفون: Valdinoci, M., Ventura, D., Vecchi, M.C., Rudan, M., Baccarani, G., Illien, F., Stricker, A., Zullino, L.
المصدر: 1999 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD'99 (IEEE Cat. No.99TH8387) Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 1999. SISPAD '99. 1999 International Conference on. :27-30 1999
Relation: Proceedings of International Conference on Simulation of Semiconductor Process and Devices. SISPAD 99
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6دورية أكاديمية
المؤلفون: Di Biccari, L., Cerati, L., Pozzobon, F., Zullino, L., Morin, S., Pizzo, G., Boroni, A., Andreini, A.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 15(3):280-288 Sep, 2015
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7دورية أكاديمية
المؤلفون: Blaho, M., Zullino, L., Wolf, H., Stella, R., Andreini, A., Gieser, H.A., Pogany, D., Gornik, E.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 4(3):535-541 Sep, 2004
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8مؤتمر
المؤلفون: Fourneris, G., Bekkara, N., Benkoski, J., Zullino, L., Spatafora, D., Martino, G.
المصدر: Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Design automation Design Automation Conference, 1993, with EURO-VHDL '93. Proceedings EURO-DAC '93., European. :178-183 1993
Relation: Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference
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9دورية أكاديمية
المؤلفون: Reggiani, S., Valdinoci, M., Colalongo, L., Rudan, M., Baccarani, G., Stricker, A.D., Illien, F., Felber, N., Fichtner, W., Zullino, L.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 49(3):490-499 Mar, 2002
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10مؤتمر
المؤلفون: Heer, M., Bychikhin, S., Dubec, V., Pogany, D., Gornik, E., Dissegna, M., Cerati, L., Zullino, L., Andreini, A., Tazzoli, A., Meneghesso, G.
المصدر: 2006 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.. :275-284 Sep, 2006
Relation: 2006 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)