يعرض 1 - 10 نتائج من 33,960 نتيجة بحث عن '"(SiO2)"', وقت الاستعلام: 0.86s تنقيح النتائج
  1. 1
    مؤتمر
    Interpixel Charge Dynamics in Trench-Isolated Si-Based Sensors

    المؤلفون: Lastovicka-Medin, Gordana, Rebarz, Mateusz

    المصدر: 2024 13th Mediterranean Conference on Embedded Computing (MECO) Embedded Computing (MECO), 2024 13th Mediterranean Conference on. :1-4 Jun, 2024

    Relation: 2024 13th Mediterranean Conference on Embedded Computing (MECO)

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  2. 2
    دورية أكاديمية
    High-Resolution Metal-Oxide-4H-SiC Radiation Detectors: A Review

    المؤلفون: Mandal, K.C., Chaudhuri, S.K., Ruddy, F.H.

    المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(8):2026-2035 Aug, 2024

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  3. 3
    دورية أكاديمية
    From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks

    المؤلفون: Vecchi, S., Padovani, A., Pavan, P., Puglisi, F.M.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):194-202 Jun, 2024

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  4. 4
    مؤتمر
    The Impact of Selectively Filling with SiO2on Transverse Modes in TC-SAW Resonators

    المؤلفون: Li, Menghui, Qi, Mengke, Chen, Yuanhang, Cheng, Yimim, Cao, Liang, Mu, Xiaojing

    المصدر: 2024 IEEE MTT-S International Conference on Microwave Acoustics & Mechanics (IC-MAM) Microwave Acoustics & Mechanics (IC-MAM), 2024 IEEE MTT-S International Conference on. :133-136 May, 2024

    Relation: 2024 IEEE MTT-S International Conference on Microwave Acoustics & Mechanics (IC-MAM)

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  5. 5
    مؤتمر
    Design and Analysis of a Vanadium Dioxide-Based Terahertz Absorber

    المؤلفون: Nasif, Mohammad Abrar, Newaz, Abdullah Al Hossain, Hasan, Nowshad, Haq, Md. Rafiul, Uddin, Md Mahatab, Niloy, Md. Nazim Uddin

    المصدر: 2024 3rd International Conference on Advancement in Electrical and Electronic Engineering (ICAEEE) Advancement in Electrical and Electronic Engineering (ICAEEE), 2024 3rd International Conference on. :1-6 Apr, 2024

    Relation: 2024 3rd International Conference on Advancement in Electrical and Electronic Engineering (ICAEEE)

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  6. 6
    مؤتمر
    Analysis of DC Characteristics for Tin Oxide (SnO2) based Thin Film Transistor infused with Nickel Material

    المؤلفون: S, Vengidusamy., Kanagavalli, R., Priya, P., Saravanan, S., Kalaiyarasi, M.

    المصدر: 2024 Third International Conference on Intelligent Techniques in Control, Optimization and Signal Processing (INCOS) Intelligent Techniques in Control, Optimization and Signal Processing (INCOS), 2024 Third International Conference on. :1-5 Mar, 2024

    Relation: 2024 Third International Conference on Intelligent Techniques in Control, Optimization and Signal Processing (INCOS)

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  7. 7
    دورية أكاديمية
    Reliability of Quasi-vertical GaN on Silicon Schottky Barrier Diodes With SiO₂ Passivation Layer Under On-State Stress Bias

    المؤلفون: Lin, Y., Chao, D., Liang, J., Shen, Y., Huang, C., Hall, S., Mitrovic, I.Z.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(9):5296-5304 Sep, 2024

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  8. 8
    مؤتمر
    High quality PVD-MoS2 film on plasma-ALD-SiO2 underlaying material for CFET integration

    المؤلفون: Matsunaga, Naoki, Imai, Shinya, Shirokura, Takanori, Tsutsui, Kazuo, Kakushima, Kuniyuki, Wakabayashi, Hitoshi

    المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

    Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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  9. 9
    دورية أكاديمية
    Estimating the Number of Defects in a Single Breakdown Spot of a Gate Dielectric

    المؤلفون: Ranjan, A., Padovani, A., Dianat, B., Raghavan, N., Pey, K.L., O'Shea, S.J.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(5):809-812 May, 2024

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  10. 10
    دورية أكاديمية
    Fabrication of the Highly Ordered Silicon Nanocone Array With Sub-5 nm Tip Apex by Tapered Silicon Oxide Mask

    المؤلفون: Pan, A., Zhu, C., Yan, Z., Zhu, X., Liu, Z., Cui, B.

    المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 37(2):160-165 May, 2024

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