المؤلفون: Benea, L., Popescu, M., Bawedin, M., Simion, M., Ionica, I.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 20(23):14032-14041 Dec, 2020

المؤلفون: Benea, Licinius, Bawedin, Maryline, Cristoloveanu, Sorin, Ionica, Irina, Banu, Melania, Simion, Monica, Kusko, Mihaela, Delacour, Cecile

المصدر: 2018 International Semiconductor Conference (CAS) International Semiconductor Conference (CAS), 2018. :143-146 Oct, 2018

Relation: 2018 International Semiconductor Conference (CAS)

المؤلفون: Benea, Licinius, Cerba, Tiphaine, Bawedin, Maryline, Delacour, Cecile, Cristoloveanu, Sorin, Ionica, Irina

المصدر: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2018 Joint International EUROSOI Workshop and International Conference on. :1-4 Mar, 2018

Relation: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

المؤلفون: Benea, Licinius, Bawedin, Maryline, Delacour, Cecile, Cristoloveanu, Sorin, Ionica, Irina

المصدر: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2017 Joint International EUROSOI Workshop and International Conference on. :19-22 Apr, 2017

Relation: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

المؤلفون: Pirro, L., Diab, A., Ionica, I., Ghibaudo, G., Faraone, L., Cristoloveanu, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 62(9):2717-2723 Sep, 2015

المؤلفون: Lee, Se-Won, Cho, Won-Ju

المصدر: Journal of the Korean Physical Society. May 2012 60(9):1317-1321

المؤلفون: Cécile Delacour, Melania Banu, Mihaela Kusko, Licinius Benea, Maryline Bawedin, Sorin Cristoloveanu, Monica Simion, I. Ionica

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), National Institute for Research and Development in Microtechnologies (IMT-Bucharest), Thermodynamique et biophysique des petits systèmes (NEEL - TPS), Institut Néel (NEEL), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), PHC Brancusi (project 38 395QA), European Project: 687931,H2020,H2020-ICT-2015,REMINDER(2016), European Project: 662175,H2020,ECSEL-2014-2,WAYTOGO FAST(2015), Thermodynamique et biophysique des petits systèmes (TPS)

المصدر: 2018 CAS Proceedings
2018 International Semiconductor Conference (CAS)
2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.143-146, ⟨10.1109/SMICND.2018.8539753⟩

مصطلحات موضوعية: DNA detection, SOI, Work (thermodynamics), Materials science, [SDV.BIO]Life Sciences [q-bio]/Biotechnology, business.industry, 010401 analytical chemistry, Field effect, Silicon on insulator, Charge (physics), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Fluorescence, 0104 chemical sciences, Threshold voltage, ψ-MOSFET, MOSFET, Optoelectronics, field-effect, Sensitivity (control systems), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, surface functionalization

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::16d7d0583f5d7f13ded87be976ef86a6
https://hal.science/hal-02007655

المؤلفون: Licinius Benea, Maryline Bawedin, Cécile Delacour, Sorin Cristoloveanu, T. Cerba, I. Ionica

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Laboratoire des technologies de la microélectronique (LTM ), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Thermodynamique et biophysique des petits systèmes (TPS), Institut Néel (NEEL), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), AGIR-POLE CLEPS, ANR-10-LABX-0055,MINOS Lab,Minatec Novel Devices Scaling Laboratory(2010), European Project: 662175,H2020,ECSEL-2014-2,WAYTOGO FAST(2015), European Project: 687931,H2020,H2020-ICT-2015,REMINDER(2016), Thermodynamique et biophysique des petits systèmes (NEEL - TPS)

المصدر: 2018 EUROSOI-ULIS Proceedings
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, Spain. pp.141-144, ⟨10.1109/ULIS.2018.8354754⟩

مصطلحات موضوعية: 010302 applied physics, SOI, [PHYS]Physics [physics], Materials science, Condensed matter physics, Silicon, nanoindentation, chemistry.chemical_element, Ψ-MOSFET, 02 engineering and technology, Nanoindentation, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, metal-semiconductor contact, Pressure measurement, Electrical transport, chemistry, law, 0103 physical sciences, MOSFET, field-effect, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, Drain current

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b962f9a95bc2ebb13ce0132622e04d70
https://hal.univ-grenoble-alpes.fr/hal-01948053

المؤلفون: Sorin Cristoloveanu, Licinius Benea, I. Ionica, Cécile Delacour, Maryline Bawedin

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Thermodynamique et biophysique des petits systèmes (TPS), Institut Néel (NEEL), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])

المصدر: 2017 EUROSOI-ULIS Proceedings
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.19-22, ⟨10.1109/ULIS.2017.7962590⟩

مصطلحات موضوعية: Materials science, [SDV.BIO]Life Sciences [q-bio]/Biotechnology, Silicon on insulator, Field effect, Nanotechnology, 02 engineering and technology, Hardware_PERFORMANCEANDRELIABILITY, 7. Clean energy, 01 natural sciences, body potential, 0103 physical sciences, MOSFET, Hardware_INTEGRATEDCIRCUITS, Wafer, field-effect, Surface charge, Sensitivity (control systems), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 010302 applied physics, SOI, business.industry, Ψ-MOSFET, 021001 nanoscience & nanotechnology, Optoelectronics, biochemical sensor, Electric potential, 0210 nano-technology, business, Biosensor

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a8dbd7cee94bf280bc5433a7fe531d00
https://hal.archives-ouvertes.fr/hal-02007128

المؤلفون: Pirro, Luca

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Université Grenoble Alpes, Sorin Cristoloveanu, Irina Stefana Ionica, STAR, ABES

المصدر: Micro and nanotechnologies/Microelectronics. Université Grenoble Alpes, 2015. English. ⟨NNT : 2015GREAT096⟩

مصطلحات موضوعية: Silicon-on-insulator (SOI), Silicium-sur-isolant (SOI), Low-frequency noise (LFN), Statique ID-VG, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Pseudo-MOSFET (Ψ-MOSFET), III-V materials, Semiconducteurs III-V, Bruit basse fréquence (LFN), Capacité quasi-statique (QSCV), Split-CV, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Static ID-VG, Quasi-static capacitance (QSCV)

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3e5593648f7cad04b2260547754297b4
https://tel.archives-ouvertes.fr/tel-01254695