يعرض 1 - 10 نتائج من 220 نتيجة بحث عن '"3D metrology"', وقت الاستعلام: 0.89s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2023 IEEE 73rd. :943-950 May, 2023

    Relation: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)

  2. 2
    دورية أكاديمية

    المصدر: IEEE Journal of Microwaves IEEE J. Microw. Microwaves, IEEE Journal of. 3(3):962-969 Jul, 2023

  3. 3
    مؤتمر

    المصدر: 2022 XXV International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2022 XXV International Conference on. :10-14 May, 2022

    Relation: 2022 XXV International Conference on Soft Computing and Measurements (SCM)

  4. 4
    مؤتمر

    المصدر: 2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus) Russian Young Researchers in Electrical and Electronic Engineering (ElConRus), 2022 Conference of. :1098-1102 Jan, 2022

    Relation: 2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus)

  5. 5
    مؤتمر

    المصدر: 2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus) Russian Young Researchers in Electrical and Electronic Engineering (ElConRus), 2022 Conference of. :1103-1106 Jan, 2022

    Relation: 2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus)

  6. 6
    مؤتمر

    المصدر: 2021 IEEE 71st Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2021 IEEE 71st. :2196-2204 Jun, 2021

    Relation: 2021 IEEE 71st Electronic Components and Technology Conference (ECTC)

  7. 7
    مؤتمر

    المصدر: 2020 International Wafer Level Packaging Conference (IWLPC) Wafer Level Packaging Conference (IWLPC), 2020 International. :01-07 Oct, 2020

    Relation: 2020 International Wafer Level Packaging Conference (IWLPC)

  8. 8
    كتاب إلكتروني

    المؤلفون: Shi, ShengxianAff3, Quinn, Mark KennethAff4

    المساهمون: Shi, Shengxian, editorAff1, New, T. H., editorAff2

    المصدر: Development and Application of Light-Field Cameras in Fluid Measurements. :115-128

  9. 9
    مؤتمر

    المصدر: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018 29th Annual. :320-323 Apr, 2018

    Relation: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

  10. 10
    مؤتمر

    المصدر: 2017 23rd International Conference on Virtual System & Multimedia (VSMM) Virtual System & Multimedia (VSMM) , 2017 23rd International Conference on. :1-8 Oct, 2017

    Relation: 2017 23rd International Conference on Virtual System & Multimedia (VSMM)