المؤلفون: Saha, Ambarneil, Nia, Shervin S, Rodriguez, Jose A

المصدر: Chemical Reviews. 122(17)

مصطلحات موضوعية: Electron diffraction, electron crystallography, MicroED, 3D ED

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/5t32t5sh

المؤلفون: Yang, Taimin, 1991, Xu, Hongyi, Zou, Xiaodong

المصدر: Journal of applied crystallography. 55(6):1583-1591

مصطلحات موضوعية: post-column energy filters, 3D electron diffraction, energy-filtered 3D ED, microcrystal electron diffraction, energy-filtered MicroED, HAADF, crystal tracking, structure determination

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:su:diva-213396
https://doi.org/10.1107/S1600576722009633

المؤلفون: Samperisi, Laura, 1993, Zou, Xiaodong, Huang, Zhehao

المصدر: IUCrJ. 9:480-491

مصطلحات موضوعية: anisotropic displacement parameters, ADPs, three-dimensional electron diffraction, 3D ED, continuous rotation electron diffraction, metal-organic frameworks

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:su:diva-208492
https://doi.org/10.1107/S2052252522005632

المؤلفون: Bengtsson, Viktor E. G., 1989, Pacoste, Laura, de la Rosa-Trevin, José Miguel, Hofer, Gerhard, Zou, Xiaodong, Xu, Hongyi

المصدر: Journal of applied crystallography. 55(3):638-646

مصطلحات موضوعية: electron diffraction, 3D ED, MicroED, data processing, computer programs., oorganisk kemi, Inorganic Chemistry

وصف الملف: electronic

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:su:diva-204705
https://su.diva-portal.org/smash/get/diva2:1658974/FULLTEXT01.pdf
https://su.diva-portal.org/smash/get/diva2:1658974/ATTACHMENT01.pdf

المؤلفون: Taylan Örs, Irena Deroche, Corentin Chatelard, Mathias Dodin, Raquel Martinez-Franco, Alain Tuel, Jean-Louis Paillaud

المصدر: Symmetry, Vol 16, Iss 4, p 477 (2024)

مصطلحات موضوعية: nanozeolite, ECR-1, 3D ED, precession, kinematical and dynamical refinement, Monte Carlo simulation, Mathematics, QA1-939

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2073-8994/16/4/477; https://doaj.org/toc/2073-8994

URL الوصول: https://doaj.org/article/451008c0988240618a99a21cec83ab4f

المؤلفون: Laura Samperisi, Xiaodong Zou, Zhehao Huang

المصدر: IUCrJ, Vol 9, Iss 4, Pp 480-491 (2022)

مصطلحات موضوعية: anisotropic displacement parameters, adps, three-dimensional electron diffraction, 3d ed, continuous rotation electron diffraction, metal-organic frameworks, Crystallography, QD901-999

وصف الملف: electronic resource

Relation: http://scripts.iucr.org/cgi-bin/paper?S2052252522005632; https://doaj.org/toc/2052-2525

URL الوصول: https://doaj.org/article/1060892d737748c4a09be4360e75c663

المؤلفون: Khai-Nghi Truong, Sho Ito, Jakub M. Wojciechowski, Christian R. Göb, Christian J. Schürmann, Akihito Yamano, Mark Del Campo, Eiji Okunishi, Yoshitaka Aoyama, Tomohiro Mihira, Naoki Hosogi, Jordi Benet-Buchholz, Eduardo Carmelo Escudero-Adán, Fraser J. White, Joseph D. Ferrara, Robert Bücker

المصدر: Symmetry, Vol 15, Iss 8, p 1555 (2023)

مصطلحات موضوعية: electron diffraction, 3D ED, MicroED, single crystal diffraction, structure determination, absolute structure, Mathematics, QA1-939

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2073-8994/15/8/1555; https://doaj.org/toc/2073-8994

URL الوصول: https://doaj.org/article/5dfd7c8c9aa449aeb741a4387f635f84

المؤلفون: Yonekura, Koji^{Aff12, Aff13, Aff14}, Maki-Yonekura, Saori^Aff12, Hamaguchi, Tasuku^Aff12, Naitow, Hisashi^Aff12, Takaba, Kiyofumi^Aff12, Kawakami, Keisuke^Aff12

المساهمون: Ghosh, Arindam, Series Editor^Aff1, Chua, Daniel, Series Editor^Aff2, de Souza, Flavio Leandro, Series Editor^Aff3, Aktas, Oral Cenk, Series Editor^Aff4, Han, Yafang, Series Editor^Aff5, Gong, Jianghong, Series Editor^Aff6, Jawaid, Mohammad, Series Editor^Aff7, Ghosal, Partha, editor^Aff8, Carter, C. Barry, editor^Aff9, Vinothkumar, Kutti Ragunath, editor^Aff10, Sarkar, Rajdeep, editor^Aff11

المصدر: Applications of Microscopy in Materials and Life Sciences : Proceedings of 12th Asia-Pacific Microscopy Conference. 11:233-241

المؤلفون: Sara Passuti, Julien Varignon, Adrian David, Philippe Boullay

المصدر: Symmetry, Vol 15, Iss 7, p 1459 (2023)

مصطلحات موضوعية: 3D ED, electron diffraction, thin films, perovskite, Mathematics, QA1-939

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2073-8994/15/7/1459; https://doaj.org/toc/2073-8994

URL الوصول: https://doaj.org/article/ff47825744b34e49bf80d7f1a8bb29e7

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