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1دورية أكاديمية
المؤلفون: Sagar Shrestha, Sajjan Parajuli, Jinhwa Park, Hao Yang, Tae-Yeon Cho, Ji-Ho Eom, Seong-Keun Cho, Jongsun Lim, Gyoujin Cho, Younsu Jung
المصدر: Nanomaterials, Vol 13, Iss 3, p 559 (2023)
مصطلحات موضوعية: roll to roll, PECVD, passivation, threshold voltage, silicon nitride, 85/85 test, Chemistry, QD1-999
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Putaala, J., Niittynen, J., Hannu, J., Myllymaki, S., Kunnari, E., Mantysalo, M., Hagberg, J., Jantunen, H.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 17(2):281-290 Jun, 2017
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3دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
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المؤلفون: Esa Kunnari, Matti Mäntysalo, Heli Jantunen, Sami Myllymäki, Juha Niittynen, Juha Hagberg, Jussi Putaala, Jari Hannu
المساهمون: Tampere University, Electronics and Communications Engineering, Research group: Laboratory for Future Electronics
مصطلحات موضوعية: Materials science, Silicon, Scanning electron microscope, chemistry.chemical_element, 02 engineering and technology, Substrate (printing), interconnections, 0202 electrical engineering, electronic engineering, information engineering, 85/85 test, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Electrical conductor, Interconnection, reliability, Inkwell, business.industry, 213 Electronic, automation and communications engineering, electronics, direct chip attachment, Electrical engineering, 020206 networking & telecommunications, 021001 nanoscience & nanotechnology, Chip, Electronic, Optical and Magnetic Materials, chemistry, inkjet, Optoelectronics, 0210 nano-technology, business, Flip chip
وصف الملف: fulltext; application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a6a24cd4611d1a6131deec93cd2054d5
https://trepo.tuni.fi/handle/10024/126212 -
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