يعرض 1 - 10 نتائج من 2,444 نتيجة بحث عن '"A Chasin"', وقت الاستعلام: 1.29s تنقيح النتائج
  1. 1
    مؤتمر
    Fundamental understanding of NBTI degradation mechanism in IGZO channel devices

    المؤلفون: Zhao, Ying, Rinaudo, Pietro, Chasin, Adrian, Truijen, Brecht, Kaczer, Ben, Rassoul, Nouredine, Dekkers, Harold, Belmonte, Attilio, De Wolf, Ingrid, Kar, Gouri, Franco, Jacopo

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  2. 2
    مؤتمر
    Light-Assisted Investigation of the Role of Oxygen Flow during IGZO Deposition on Deep Subgap States and their Evolution Under PBTI

    المؤلفون: Rinaudo, Pietro, Chasin, Adrian, Zhao, Ying, Kaczer, Ben, Rassoul, Nouredine, Dekkers, Harold F.W., van Setten, Michiel J., Belmonte, Attilio, De Wolf, Ingrid, Kar, Gouri, Franco, Jacopo

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  3. 3
    مؤتمر
    Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance

    المؤلفون: Higashi, Y., Bastos, J. P., Chasin, A., Breuil, L., Arreghini, A., Ramesh, S., Rachidi, S., Jeong, Y., Van den bosch, G., Rosmeulen, M.

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    DC Reliability Study of $\text{high}-\kappa$ GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers

    المؤلفون: O'Sullivan, B. J., Alian, A., Sibaja-Hernandez, A., Franco, J., Yadav, S., Yu, H., Rathi, A., Peralagu, U., Chasin, A., Parvais, B., Collaert, N.

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-9 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  5. 5
    دورية أكاديمية
    Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors With SiO₂ Oxygen-Penetration Layers

    المؤلفون: Guo, Z., Zhang, E.X., Chasin, A., Linten, D., Belmonte, A., Kar, G., Reed, R.A., Schrimpf, R.D., Fleetwood, D.M.

    المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):461-468 Apr, 2024

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  6. 6
    دورية أكاديمية
    The Impact of IGZO Channel Composition on DRAM Transistor Performance

    المؤلفون: Kruv, A., Van Setten, M.J., Dekkers, H.F.W., Lorant, C., Verreck, D., Smets, Q., Venkataramana, B.Y., Belmonte, A., Subhechha, S., Chasin, A.V., Delhougne, R., Kar, G.S.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(9):4674-4679 Sep, 2023

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  7. 7
    دورية أكاديمية
    Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI

    المؤلفون: Rinaudo, P., Chasin, A., Franco, J., Wu, Z., Subhechha, S., Arutchelvan, G., Eneman, G., Ramana, B.Y.V., Rassoul, N., Delhougne, R., Kaczer, B., De Wolf, I., Kar, G.S.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):337-345 Sep, 2023

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  8. 8
    مؤتمر
    Side and Corner Region Non-Uniformities in Grown SiO2 and Their Implications on Current, Capacitance and Breakdown Characteristics

    المؤلفون: Bastos, J. P., O'Sullivan, B. J., Higashi, Y., Chasin, A., Franco, J., Arimura, H., Ganguly, J., Capogreco, E., Spessot, A., Horiguchi, N.

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P36.PI-1-P36.PI-7 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  9. 9
    مؤتمر
    MTJ degradation in multi-pillar SOT-MRAM with selective writing

    المؤلفون: Van Beek, Simon, Cai, Kaiming, Fan, Kaiquan, Talmelli, Giacomo, Trovato, Anna, Jossart, Nico, Rao, Siddharth, Chasin, Adrian, Couet, Sebastien

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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  10. 10
    مؤتمر
    Reliability challenges in Forksheet Devices: (Invited Paper)

    المؤلفون: Bury, E., Vandemaele, M., Franco, J., Chasin, A., Tyaginov, S., Vandooren, A., Ritzenthaler, R., Mertens, H., Fortuny, J. Diaz, Horiguchi, N., Linten, D., Kaczer, B.

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-8 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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