المؤلفون: Chang, S. Z., Yu, H. Y., Adelmann, C., Delabie, A., Wang, X. P., Van Elshocht, S., Akheyar, A., Nyns, L., Swerts, J., Aoulaiche, M., Kerner, C., Absil, P., Hoffmann, T. Y., Biesemans, S.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(5):430-433 May, 2008

المؤلفون: Ortolland, C., Ragnarsson, L.-A., Favia, P., Richard, O., Kerner, C., Chiarella, T., Rosseel, E., Okuno, Y., Akheyar, A., Tseng, J., Everaert, J.-L., Schram, T., Kubicek, S., Aoulaiche, M., Cho, M.J., Absil, P.P., Biesemans, S., Hoffmann, T.

المصدر: 2009 Symposium on VLSI Technology VLSI Technology, 2009 Symposium on. :38-39 Jun, 2009

Relation: 2009 Symposium on VLSI Technology

المؤلفون: Aoulaiche, M., Kaczer, B., Cho, M., Houssa, M., Degraeve, R., Kauerauf, T., Akheyar, A., Schram, T., Roussel, Ph., Maes, H.E., Hoffmann, T., Biesemans, S., Groeseneken, G.

المصدر: 2009 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2009 IEEE International. :1014-1018 Apr, 2009

Relation: 2009 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Schram, T., Kubicek, S., Rohr, E., Brus, S., Vrancken, C., Chang, S.-Z., Chang, V.S., Mitsuhashi, R., Okuno, Y., Akheyar, A., Cho, H.-J., Hooker, J.C., Paraschiv, V., Vos, R., Sebai, F., Ercken, M., Kelkar, P., Delabie, A., Adelmann, C., Witters, T., Ragnarsson, L-A., Kerner, C., Chiarella, T., Aoulaiche, M., Moon-Ju Cho, Kauerauf, T., De Meyer, K., Lauwers, A., Hoffmann, T., Absil, P.P., Biesemans, S.

المصدر: 2008 Symposium on VLSI Technology VLSI Technology, 2008 Symposium on. :44-45 Jun, 2008

Relation: 2008 Symposium on VLSI Technology

المؤلفون: Kubicek, S., Schram, T., Rohr, E., Paraschiv, V., Vos, R., Demand, M., Adelmann, C., Witters, T., Nyns, L., Delabie, A., Ragnarsson, L.-A., Chiarella, T., Kerner, C., Mercha, A., Parvais, B., Aoulaiche, M., Ortolland, C., Yu, H., Veloso, A., Witters, L., Singanamalla, R., Kauerauf, T., Brus, S., Vrancken, C., Chang, V.S., Chang, S-Z., Mitsuhashi, R., Okuno, Y., Akheyar, A., Cho, H.-J., Hooker, J., O'Sullivan, B.J., Van Elshocht, S., De Meyer, K., Jurczak, M., Absil, P., Biesemans, S., Hoffmann, T.

المصدر: 2008 Symposium on VLSI Technology VLSI Technology, 2008 Symposium on. :130-131 Jun, 2008

Relation: 2008 Symposium on VLSI Technology

المؤلفون: Kubicek, S., Schram, T., Paraschiv, V., Vos, R., Demand, M., Adelmann, C., Witters, T., Nyns, L., Ragnarsson, L.-A., Yu, H., Veloso, A., Singanamalla, R., Kauerauf, T., Rohr, E., Brus, S., Vrancken, C., Chang, V. S., Mitsuhashi, R., Akheyar, A., Cho, H.-J., Hooker, J. C., O'Sullivan, B. J., Chiarella, T., Kerner, C., Delabie, A., Van Elshocht, S., De Meyer, K., De Gendt, S., Absil, P., Hoffmann, T., Biesemans, S.

المصدر: 2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :49-52 Dec, 2007

Relation: 2007 IEEE International Electron Devices Meeting

المؤلفون: Chang, V. S., Ragnarsson, L.-A., Pourtois, G., O'Connor, R., Adelmann, C., Van Elshocht, S., Delabie, A., Swerts, J., Van der Heyden, N., Conard, T., Cho, H.-J., Akheyar, A., Mitsuhashi, R., Witters, T., O'Sullivan, B. J., Pantisano, L., Rohr, E., Lehnen, P., Kubicek, S., Schram, T., De Gendt, S., Absil, P. P., Biesemans, S.

المصدر: 2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :535-538 Dec, 2007

Relation: 2007 IEEE International Electron Devices Meeting

المؤلفون: Cho, H. -J., Yu, H. Y., Ragnarsson, L.-A., Chang, V. S., Schram, T., O'Sullivan, B. J., Kubicek, S., Mitsuhashi, R., Akheyar, A., Van Elshocht, S., Witters, T., Delabie, A., Adelmann, C., Rohr, E., Singanamalla, R., Chang, S. -Z., Swerts, J., Lehnen, P., De Gendt, S., Absil, P. P., Biesemans, S.

المصدر: 2007 IEEE International Conference on Integrated Circuit Design and Technology Integrated Circuit Design and Technology, 2007. ICICDT '07. IEEE International Conference on. :1-3 May, 2007

Relation: 2007 IEEE International Conference on Integrated Circuit Design and Technology

المؤلفون: Cho, H.-J., Yu, H. Y., Chang, V. S., Akheyar, A., Jakschik, S., Conard, T., Hantschel, T., Delabie, A., Adelmann, C., Van Elshocht, S., Ragnarsson, L.-Å., Schram, T., Absil, P., Biesemans, S.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(7):743-745 Jul, 2008

المؤلفون: Tseng, J., Ragnarsson, L.-A., Schram, T., Akheyar, A., Okuno, Y., Li, Z. L., Aoulaiche, M., Rohr, E., Witters, T., Adelmann, C., Delabie, A., Paraschiv, V., Kerner, C., Xiong, K., Mueller, M., Hoffmann, T., Absil, P., Biesemans, S.

المصدر: Proceedings of 2010 International Symposium on VLSI Technology, System and Application VLSI Technology Systems and Applications (VLSI-TSA), 2010 International Symposium on. :116-117 Apr, 2010

Relation: 2010 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)