المؤلفون: Chou, Gene, Bahat, Yuval, Heide, Felix

المصدر: 2023 IEEE/CVF International Conference on Computer Vision (ICCV) ICCV Computer Vision (ICCV), 2023 IEEE/CVF International Conference on. :2262-2272 Oct, 2023

Relation: 2023 IEEE/CVF International Conference on Computer Vision (ICCV)

المؤلفون: Zur, Shalhevet Leibovitz, Bahat, Shay, Amara, Ronza, Farber, Yair^{Aff1, IDs11069024068353_cor4}

المصدر: Natural Hazards. :1-14

المؤلفون: Ploegmakers, Kim J.^{Aff1, Aff2, IDs4199902400951w_cor1}, Linn, A. J.^{Aff1, Aff2, Aff3}, Medlock, S.^{Aff2, Aff4}, Seppälä, L. J.^{Aff1, Aff2}, Bahat, G., Caballero-Mora, M. A., Ilhan, B., Landi, F., Masud, T., Morrissey, Y., Ryg, J.^{Aff11, Aff12}, Topinkova, E.^{Aff13, Aff14}, van der Velde, N.^{Aff1, Aff2}, van Weert, J. C. M.

المصدر: European Geriatric Medicine. 15(3):817-829

المؤلفون: Bahat, Idan^{Aff1, Aff2, IDs11119024101205_cor1}, Netzer, Yishai^{Aff3, Aff4}, Grünzweig, José M., Naor, Amos, Alchanatis, Victor, Ben-Gal, Alon, Keisar, Ohali’av, Lidor, Guy, Cohen, Yafit

المصدر: Precision Agriculture: An International Journal on Advances in Precision Agriculture. 25(3):1477-1501

المؤلفون: Hilt, Oliver, Brunner, Frank, Wolf, Mihaela, Treidel, Eldad Bahat, Wurfl, Joachim, Thies, Andreas, Mogilatenko, Anna

المصدر: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2023 35th International Symposium on. :374-377 May, 2023

Relation: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

المؤلفون: Mitterhuber, Lisa, Leitgeb, Verena, Krainz, Markus, Strauss, Robert, Kaden, Thomas, Treidel, Eldad Bahat, Brunner, Frank, Huber, Christian, Kraker, Elke

المصدر: 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2023 24th International Conference on. :1-8 Apr, 2023

Relation: 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

المؤلفون: Fregolent, Manuel, Marcuzzi, Alberto, De Santi, Carlo, Treidel, Eldad Bahat, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Isa Bahat (ORCID 0000-0002-5600-2449), Sevgi Ernas, Metin Isik

المصدر: Pegem Journal of Education and Instruction. 2023 13(4):330-343.

Peer Reviewed: Y

Page Count: 14

Descriptors: Dropout Characteristics, College Students, Management Information Systems, Student Motivation, Student Attitudes, Change, Foreign Countries, Dropout Attitudes, Emotional Response, Educational Environment

مصطلحات جغرافية: Turkey

المؤلفون: Isa Bahat (ORCID 0000-0002-5600-2449)

المصدر: International Journal of Psychology and Educational Studies. 2023 10(4):928-941.

Peer Reviewed: Y

Page Count: 14

Descriptors: Social Media, Addictive Behavior, College Students, Student Behavior, Family Characteristics, Student Characteristics, Institutional Characteristics, Public Colleges, Private Colleges, Foreign Countries

مصطلحات جغرافية: Turkey

المؤلفون: Cohen, Noa, Manor, Hila, Bahat, Yuval, Michaeli, Tomer

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition, Computer Science - Machine Learning, Electrical Engineering and Systems Science - Image and Video Processing

URL الوصول: http://arxiv.org/abs/2310.16047