المؤلفون: Adamson, Duncan, Fleischmann, Pamela, Huch, Annika

مصطلحات موضوعية: Computer Science - Data Structures and Algorithms, Mathematics - Combinatorics

URL الوصول: http://arxiv.org/abs/2407.18620

المؤلفون: Adamson, Duncan, Fleischmann, Pamela, Huch, Annika, Wiedenhöft, Max

مصطلحات موضوعية: Computer Science - Formal Languages and Automata Theory, Mathematics - Combinatorics, 68R15, G.2.1, F.4.3

URL الوصول: http://arxiv.org/abs/2407.18599

المؤلفون: Huch, Easton, Nahum-Shani, Inbal, Potter, Lindsey, Lam, Cho, Wetter, David W., Dempsey, Walter

مصطلحات موضوعية: Statistics - Methodology

URL الوصول: http://arxiv.org/abs/2403.13934

المؤلفون: Kilian, Tobias, Sengupta, Abhishek, Tille, Daniel, Huch, Martin, Schlichtmann, Ulf

المصدر: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023

Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Huch, Sebastian, Sauerbeck, Florian, Betz, Johannes

المصدر: 2023 IEEE Intelligent Vehicles Symposium (IV) Intelligent Vehicles Symposium (IV), 2023 IEEE. :1-8 Jun, 2023

Relation: 2023 IEEE Intelligent Vehicles Symposium (IV)

المؤلفون: Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Martone, R., Schlichtmann, U., Squillero, G.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(10):3436-3449 Oct, 2023

المؤلفون: Schweizer, D., Rau, R., Bezek, C.D., Kubik-Huch, R.A., Goksel, O.

المصدر: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control IEEE Trans. Ultrason., Ferroelect., Freq. Contr. Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on. 70(10):1308-1318 Oct, 2023

المؤلفون: Huch, Easton K., Shi, Jieru, Abbott, Madeline R., Golbus, Jessica R., Moreno, Alexander, Dempsey, Walter H.

مصطلحات موضوعية: Statistics - Machine Learning, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2312.06403

المؤلفون: Schulz, Bastian^{Aff1, Aff2}, Euler, André, Schmid, Hans-Ruedi, Kubik-Huch, Rahel A., Thali, Michael, Niemann, Tilo^{Aff1, IDs00330024108206_cor6}

المصدر: European Radiology. :1-10

المؤلفون: Bellarmino, Nicolo, Cantoro, Riccardo, Huch, Martin, Kilian, Tobias, Schlichtmann, Ulf, Squillero, Giovanni

المصدر: 2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-6 May, 2023

Relation: 2023 IEEE European Test Symposium (ETS)