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المؤلفون: Gabriele Boschi, Marc Reuben Hutner, J. Mekkoth, Hayk Grigoryan, D. Lazzarotti, G. Tshagharyan, Yervant Zorian, H. Shaheen, S. Bandyopadhyay, D. Luongo, G. Harutyunyan, A. Kumar S. Shoukourian
المصدر: VTS
مصطلحات موضوعية: Interconnection, Hardware_MEMORYSTRUCTURES, Computer science, business.industry, Automotive industry, System testing, Session (computer science), business, Memory array, Reliability (statistics), Dram, Reliability engineering, Test (assessment)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f1576e0e51f6e2468dbea41af9719967
https://doi.org/10.1109/vts.2019.8758675