يعرض 1 - 10 نتائج من 9,012 نتيجة بحث عن '"A. Manenti"', وقت الاستعلام: 1.26s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2024 IEEE International Symposium on Measurements & Networking (M&N) Measurements & Networking (M&N), 2024 IEEE International Symposium on. :1-6 Jul, 2024

    Relation: 2024 IEEE International Symposium on Measurements & Networking (M&N)

  2. 2
  3. 3
    مؤتمر

    المصدر: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT), 2024 IEEE International Workshop on. :536-540 May, 2024

    Relation: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT)

  4. 4
    مؤتمر

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-5 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

  5. 5
    مؤتمر

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :01-06 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

  6. 6
    تقرير

    المؤلفون: Aprile, E., Aalbers, J., Abe, K., Maouloud, S. Ahmed, Althueser, L., Andrieu, B., Angelino, E., Martin, D. Antón, Arneodo, F., Baudis, L., Bazyk, M., Bellagamba, L., Biondi, R., Bismark, A., Boese, K., Brown, A., Bruno, G., Budnik, R., Cai, C., Capelli, C., Cardoso, J. M. R., Chávez, A. P. Cimental, Colijn, A. P., Conrad, J., Cuenca-García, J. J., D'Andrea, V., Garcia, L. C. Daniel, Decowski, M. P., Deisting, A., Di Donato, C., Di Gangi, P., Diglio, S., Eitel, K., Elykov, A., Ferella, A. D., Ferrari, C., Fischer, H., Flehmke, T., Flierman, M., Fulgione, W., Fuselli, C., Gaemers, P., Gaior, R., Galloway, M., Gao, F., Ghosh, S., Giacomobono, R., Glade-Beucke, R., Grandi, L., Grigat, J., Guan, H., Guida, M., Gyorgy, P., Hammann, R., Higuera, A., Hils, C., Hoetzsch, L., Hood, N. F., Iacovacci, M., Itow, Y., Jakob, J., Joerg, F., Kaminaga, Y., Kara, M., Kavrigin, P., Kazama, S., Kobayashi, M., Koke, D., Kopec, A., Kuger, F., Landsman, H., Lang, R. F., Levinson, L., Li, I., Li, S., Liang, S., Lin, Y. -T., Lindemann, S., Lindner, M., Liu, K., Liu, M., Loizeau, J., Lombardi, F., Long, J., Lopes, J. A. M., Luce, T., Ma, Y., Macolino, C., Mahlstedt, J., Mancuso, A., Manenti, L., Marignetti, F., Undagoitia, T. Marrodán, Martens, K., Masbou, J., Masson, E., Mastroianni, S., Melchiorre, A., Merz, J., Messina, M., Michael, A., Miuchi, K., Molinario, A., Moriyama, S., Morå, K., Mosbacher, Y., Murra, M., Müller, J., Ni, K., Oberlack, U., Paetsch, B., Pan, Y., Pellegrini, Q., Peres, R., Peters, C., Pienaar, J., Pierre, M., Plante, G., Pollmann, T. R., Principe, L., Qi, J., Qin, J., García, D. Ramírez, Rajado, M., Singh, R., Sanchez, L., Santos, J. M. F. dos, Sarnoff, I., Sartorelli, G., Schreiner, J., Schulte, P., Eißing, H. Schulze, Schumann, M., Lavina, L. Scotto, Selvi, M., Semeria, F., Shagin, P., Shi, S., Shi, J., Silva, M., Simgen, H., Takeda, A., Tan, P. -L., Thers, D., Toschi, F., Trinchero, G., Tunnell, C. D., Tönnies, F., Valerius, K., Vecchi, S., Vetter, S., Solar, F. I. Villazon, Volta, G., Weinheimer, C., Weiss, M., Wenz, D., Wittweg, C., Wu, V. H. S., Xing, Y., Xu, D., Xu, Z., Yamashita, M., Yang, L., Ye, J., Yuan, L., Zavattini, G., Zhong, M.

  7. 7
    تقرير

    المؤلفون: XENON Collaboration, Aprile, E., Aalbers, J., Abe, K., Maouloud, S. Ahmed, Althueser, L., Andrieu, B., Angelino, E., Martin, D. Antón, Arneodo, F., Baudis, L., Bazyk, M., Bellagamba, L., Biondi, R., Bismark, A., Boese, K., Brown, A., Bruno, G., Budnik, R., Cardoso, J. M. R., Chávez, A. P. Cimental, Colijn, A. P., Conrad, J., Cuenca-García, J. J., D'Andrea, V., Garcia, L. C. Daniel, Decowski, M. P., Di Donato, C., Di Gangi, P., Diglio, S., Eitel, K., Elykov, A., Ferella, A. D., Ferrari, C., Fischer, H., Flehmke, T., Flierman, M., Fulgione, W., Fuselli, C., Gaemers, P., Gaior, R., Galloway, M., Gao, F., Ghosh, S., Giacomobono, R., Glade-Beucke, R., Grandi, L., Grigat, J., Guan, H., Guida, M., Gyoergy, P., Hammann, R., Higuera, A., Hils, C., Hoetzsch, L., Hood, N. F., Iacovacci, M., Itow, Y., Jakob, J., Joerg, F., Kaminaga, Y., Kara, M., Kavrigin, P., Kazama, S., Kobayashi, M., Kopec, A., Kuger, F., Landsman, H., Lang, R. F., Levinson, L., Li, I., Li, S., Liang, S., Lin, Y. -T., Lindemann, S., Lindner, M., Liu, K., Loizeau, J., Lombardi, F., Long, J., Lopes, J. A. M., Luce, T., Ma, Y., Macolino, C., Mahlstedt, J., Mancuso, A., Manenti, L., Marignetti, F., Undagoitia, T. Marrodán, Martens, K., Masbou, J., Masson, E., Mastroianni, S., Melchiorre, A., Messina, M., Michael, A., Miuchi, K., Molinario, A., Moriyama, S., Morå, K., Mosbacher, Y., Murra, M., Müller, J., Ni, K., Oberlack, U., Paetsch, B., Pan, Y., Pellegrini, Q., Peres, R., Peters, C., Pienaar, J., Pierre, M., Plante, G., Pollmann, T. R., Principe, L., Qi, J., Qin, J., García, D. Ramírez, Rajado, M., Singh, R., Sanchez, L., Santos, J. M. F. dos, Sarnoff, I., Sartorelli, G., Schreiner, J., Schulte, D., Schulte, P., Eißing, H. Schulze, Schumann, M., Lavina, L. Scotto, Selvi, M., Semeria, F., Shagin, P., Shi, S., Shi, J., Silva, M., Simgen, H., Takeda, A., Tan, P. -L., Terliuk, A., Thers, D., Toschi, F., Trinchero, G., Tunnell, C. D., Tönnies, F., Valerius, K., Vecchi, S., Vetter, S., Solar, F. I. Villazon, Volta, G., Weinheimer, C., Weiss, M., Wenz, D., Wittweg, C., Wu, V. H. S., Xing, Y., Xu, D., Xu, Z., Yamashita, M., Yang, L., Ye, J., Yuan, L., Zavattini, G., Zhong, M.

  8. 8
  9. 9
    دورية أكاديمية

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-10 2024

  10. 10
    مؤتمر

    المصدر: 2023 IEEE Sensors Applications Symposium (SAS) Sensors Applications Symposium (SAS), 2023 IEEE. :1-5 Jul, 2023

    Relation: 2023 IEEE Sensors Applications Symposium (SAS)