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1مؤتمر
المؤلفون: Sarah Zhou Huayang, Yongliang Song, Zhuo Song, Lisa Yu Yanju, Atman Zhao Yong, Jeff Wu, Venson Chang, Kary Chien
المصدر: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the. :694-696 Jul, 2013
Relation: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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2
المؤلفون: Song Yongliang, Karry Chien, Jeff Wu, Atman Zhao Yong, Zhaoxing Chen, Zhuo Song
المصدر: ECS Transactions. 52:947-952
مصطلحات موضوعية: Work (thermodynamics), Materials science, Failure mechanism, Stress conditions, NMOS logic, Simulation, Voltage, Hot-carrier injection, Degradation (telecommunications), PMOS logic, Reliability engineering
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3
المؤلفون: Song Yongliang, Venson Chang, Jeff Wu, Atman Zhao Yong, Lisa Yu Yanju, Sarah Zhou Huayang, Kary Chien, Zhuo Song
المصدر: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: Engineering, Stress effects, Gate oxide, business.industry, MOSFET, Failure mechanism, High voltage, Stress conditions, Hot carrier reliability, business, Hot carrier degradation, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fec0e366f8f187acea6cef5a9913d9fb
https://doi.org/10.1109/ipfa.2013.6599255 -
4دورية أكاديمية
المؤلفون: KARY CHIEN, WEI-TING, ATMAN, ZHAO YONG, CHANG, VENSON, WU, JEFF
المصدر: International Journal of Reliability, Quality & Safety Engineering; Aug2013, Vol. 20 Issue 4, p-1, 20p, 2 Diagrams, 1 Chart, 8 Graphs
مصطلحات موضوعية: RISK assessment, SEMICONDUCTOR device reliability, SEMICONDUCTOR failures, SEMICONDUCTOR device testing, DIELECTRICS, RELIABILITY of electronics, SEMICONDUCTOR manufacturing
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