يعرض 1 - 10 نتائج من 144,352 نتيجة بحث عن '"ATOMIC FORCE MICROSCOPY"', وقت الاستعلام: 0.89s تنقيح النتائج
  1. 1
    مؤتمر
    Cantilevers for Atomic Force Microscopy Prepared by 3D Laser Lithography

    المؤلفون: Gaso, Peter, Bulatov, Sergii, Pudis, Dusan, Jandura, Daniel

    المصدر: 2024 ELEKTRO (ELEKTRO) ELEKTRO (ELEKTRO), 2024. :1-4 May, 2024

    Relation: 2024 ELEKTRO (ELEKTRO)

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  2. 2
    مؤتمر
    The Role of Line-Shaped Defects in Premature Breakdown of $\beta-\text{Ga}_{2}\mathrm{O}_{3}$ Power Diode and Suppression by Oxygen Annealing

    المؤلفون: Liu, Jinyang, Li, Qiuyan, Han, Zhao, Xu, Guangwei, Yang, Shu, Zheng, Zheyang, Long, Shibing

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :196-199 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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  3. 3
    مؤتمر
    Observation of Thermal Expansion Behavior of Nanotwinned-Cu/SiO2 & Regular-Cu/SiO2 Hybrid Structure via In-Situ Heating AFM

    المؤلفون: Lin, Huai-En, Chiu, Wei-Lan, Chang, Hsiang-Hung, Chen, Chih

    المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :816-820 May, 2024

    Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

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  4. 4
    مؤتمر
    Fine pitch Nb-Nb Direct Bonding for quantum applications

    المؤلفون: Renaud, Pablo, Dubarry, Christophe, Bresson, Nicolas, Deschaseaux, Edouard, Fournel, Frank, Morales, Christophe, Abadie, Karine, Thomas, Candice, Charbonnier, Jean

    المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :441-446 May, 2024

    Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

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  5. 5
    مؤتمر
    High-Throughput Characterization of Nanoscale Topography for Hybrid Bonding by Optical Interferometry

    المؤلفون: Lee, Bongsub, Zhao, Oliver, Avellan, Arianna, Sadiq, Suhail, Fountain, Gill, Suwito, Dominik, Gao, Guilian, Mirkarimi, Laura

    المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :969-975 May, 2024

    Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

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  6. 6
    رسالة جامعية
    Métodos avanzados de microscopía de fuerzas electrostáticas para el estudio de muestras biológicas

    المؤلفون: Millán Solsona, Rubén

    المساهمون: University/Department: Universitat de Barcelona. Facultat de Física

    مرشدي الرسالة: Gomila Lluch, Gabriel

    المصدر: TDX (Tesis Doctorals en Xarxa)

    مصطلحات موضوعية: Microscòpia de força atòmica, Microscopía de fuerza atómica, Atomic force microscopy, Nanoestructures, Nanoestructuras, Nanostructures, Bioenginyeria, Bioingeniería, Bioengineering, Electroestàtica, Electrostática, Electrostatics, Ciències Experimentals i Matemàtiques

    وصف الملف: application/pdf

    URL الوصول: http://hdl.handle.net/10803/688862

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  7. 7
    دورية أكاديمية
    The interface between ice and alcohols analyzed by atomic force microscopy.

    المؤلفون: Yanagisawa, Ryo, Ueda, Tadashi, Nakamoto, Kei-ichi, Lu, Zhengxi, Onishi, Hiroshi, Minato, Taketoshi

    المصدر: Journal of Chemical Physics; 7/14/2024, Vol. 161 Issue 2, p1-5, 5p

    مصطلحات موضوعية: ATOMIC force microscopy, ORGANIC solvents, YOUNG'S modulus, SURFACE phenomenon, SURFACE roughness

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  8. 8
    دورية أكاديمية
    Comparison of electrical characteristics of thin tellurium layers obtained from chemical solution and by thermal evaporation in vacuum.

    المؤلفون: Norkus, R., Klimas, V., Strazdienė, V., Devenson, J., Bukauskas, V., Niaura, G., Tamulaitis, G., Krotkus, A.

    المصدر: Journal of Applied Physics; 6/28/2024, Vol. 135 Issue 24, p1-8, 8p

    مصطلحات موضوعية: SOLUTION (Chemistry), OPTOELECTRONIC devices, TELLURIUM, TERAHERTZ spectroscopy, CHEMICAL solution deposition, ATOMIC force microscopy, RAMAN spectroscopy

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  9. 9
    دورية أكاديمية
    Strain engineering of the transition metal dichalcogenide chalcogen-alloy WSSe.

    المؤلفون: Cianci, Salvatore, Blundo, Elena, Tuzi, Federico, Cecchetti, Daniele, Pettinari, Giorgio, Felici, Marco, Polimeni, Antonio

    المصدر: Journal of Applied Physics; 6/28/2024, Vol. 135 Issue 24, p1-6, 6p

    مصطلحات موضوعية: TRANSITION metals, ATOMIC force microscopy, SEMICONDUCTOR materials, TRANSITION metal alloys, ENGINEERING

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  10. 10
    دورية أكاديمية
    Interplay between photoinduced charge and energy transfer in manganese doped perovskite quantum dots.

    المؤلفون: Panigrahi, Aradhana, Mishra, Leepsa, Dubey, Priyanka, Dutta, Soumi, Mondal, Sankalan, Sarangi, Manas Kumar

    المصدر: Journal of Chemical Physics; 6/28/2024, Vol. 160 Issue 24, p1-9, 9p

    مصطلحات موضوعية: ENERGY transfer, CHARGE transfer, QUANTUM dots, ENERGY levels (Quantum mechanics), ATOMIC force microscopy, OPTOELECTRONIC devices, MANGANESE

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