المؤلفون: Neila Hizem, Abdelkader Souifi, Slah Hlali, Abdelaali Farji, Adel Kalboussi, L. Militaru

المساهمون: Inl, Laboratoire INL UMR5270, INL - Dispositifs Electroniques (INL - DE), Institut des Nanotechnologies de Lyon (INL), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École supérieure de Chimie Physique Electronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Microélectronique et Instrumentations [Monastir], Faculté des Sciences de Monastir (FSM), Université de Monastir - University of Monastir (UM)-Université de Monastir - University of Monastir (UM)

المصدر: Journal of Alloys and Compounds
Journal of Alloys and Compounds, Elsevier, 2017, 713, pp.194

مصطلحات موضوعية: [PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics], [SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, Dielectric, Conductivity, [SPI.MAT] Engineering Sciences [physics]/Materials, 01 natural sciences, [SPI.MAT]Engineering Sciences [physics]/Materials, [PHYS] Physics [physics], Electrical resistivity and conductivity, 0103 physical sciences, Materials Chemistry, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 010302 applied physics, [PHYS]Physics [physics], [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Mechanical Engineering, Metals and Alloys, Biasing, Atmospheric temperature range, 021001 nanoscience & nanotechnology, Arrhenius plot, chemistry, Mechanics of Materials, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, Dielectric loss, 0210 nano-technology, Tin

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::997e4894b07828e2deafbc1f8d2abadd
https://hal.archives-ouvertes.fr/hal-01701530