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1دورية أكاديمية
المؤلفون: Ezrinda Mohd Zaihidee, Nor Amin Mohd Noor, Abdul Rahman Othman, Zhari Ismail, Mohd Noor Ahmad, Chew Oon Sim
المصدر: Sensors, Vol 3, Iss 10, Pp 458-471 (2003)
مصطلحات موضوعية: Electronic Nose, Orthosiphon stamineus, Fast Gas Chromatography, Chemometric, Virtual chemical sensor, Pattern recognition, Chemical technology, TP1-1185
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Muhammad Suzuri Hitam, Abdul Rahman Othman, Ali Yeon Md Shakaff, Mohd Noor Ahmad, Teo Jau Shya, Maxsim Yap Mee Sim
المصدر: Sensors, Vol 3, Iss 9, Pp 340-349 (2003)
مصطلحات موضوعية: Disposable taste sensor, Screen-Printed, Milk quality control, Pattern recognition, Chemical technology, TP1-1185
وصف الملف: electronic resource
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3
المؤلفون: Abdul Rahman Othman, Choo Heng Lai, Sonia Aissa Sonia Aissa, Nora Muda
المصدر: Sains Malaysiana. 52:295-304
مصطلحات موضوعية: Multidisciplinary
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::01170bbdab3fb35fe1d6189a8c098b8c
https://doi.org/10.17576/jsm-2023-5201-24 -
4
المؤلفون: Adeline Feybesse, Corinne Berges, Wan Abdul Rahman Othman
المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: Semiconductor industry, Engineering, Reliability (semiconductor), business.industry, Delamination, Automotive industry, Wafer, business, Risk assessment, Field (computer science), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5337b842d527ed426f98067d45be0ea2
https://doi.org/10.1109/ipfa.2016.7564314 -
5
المؤلفون: Lee Weng Hong, Wan Abdul Rahman Othman, Foo Loke Sheng
المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: Materials science, business.industry, Ball grid array, Electrical engineering, Electronic engineering, Electrical analysis, Semiconductor device, Electrical integrity, Fault (power engineering), business, Fault detection and isolation, Parametric statistics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3f15e6a9ff7175c6241b7aab4182bcf4
https://doi.org/10.1109/ipfa.2016.7564326 -
6
المؤلفون: Yih Tyng Tan, Abdul Rahman Othman
المصدر: AIP Conference Proceedings.
مصطلحات موضوعية: Taxonomy (general), Independence test, Independence (mathematical logic), Affect (psychology), Social psychology, Reliability (statistics), Cognitive psychology, Test (assessment), Mathematics, Continuous assessment
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7
المؤلفون: Abdul Rahman Othman
المصدر: AIP Conference Proceedings.
مصطلحات موضوعية: Sampling distribution, Computer science, Resampling, Statistics, Monte Carlo method, Statistical inference, Inference, Field (computer science), Statistician