المؤلفون: Abe D. Hofman, Matthieu J. S. Brinkhuis, Maria Bolsinova, Jonathan Klaiber, Gunter Maris, Han L. J. van der Maas

المصدر: Journal of Intelligence, Vol 8, Iss 1, p 10 (2020)

مصطلحات موضوعية: computerized adaptive learning systems, student modelling, tracking, statistical inferences, Social sciences (General), H1-99

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2079-3200/8/1/10; https://doaj.org/toc/2079-3200

URL الوصول: https://doaj.org/article/5606408e805f4900894a518c474fe254

المؤلفون: Abe D Hofman, Ingmar Visser, Brenda R J Jansen, Han L J van der Maas

المصدر: PLoS ONE, Vol 10, Iss 10, p e0136449 (2015)

مصطلحات موضوعية: Medicine, Science

وصف الملف: electronic resource

Relation: http://europepmc.org/articles/PMC4623502?pdf=render; https://doaj.org/toc/1932-6203

URL الوصول: https://doaj.org/article/a9d7b0cb22fb4016a3ea208a89dd095f

المؤلفون: Hofman, Abe D. (ORCID 0000-0003-4269-5296), Brinkhuis, Matthieu J. S. (ORCID 0000-0003-1054-6683), Bolsinova, Maria, Klaiber, Jonathan, Maris, Gunter, van der Maas, Han L. J.

المصدر: Journal of Intelligence. 2020 8.

Peer Reviewed: Y

Page Count: 15

Descriptors: Teaching Methods, Computer Assisted Instruction, Difficulty Level, Individualized Instruction, Learning Analytics, Integrated Learning Systems, Error Patterns, Responses, Statistical Inference, Cognitive Ability, Testing, Comparative Analysis, Competition, Educational Games, Computer Games, Probability, Visual Aids, Item Response Theory, Mathematics Instruction

المؤلفون: Ou, Lu, Hofman, Abe D., Simmering, Vanessa R., Bechger, Timo, Maris, Gunter, van der Maas, Han L. J.

المصدر: International Educational Data Mining Society. 2019.

Peer Reviewed: Y

Page Count: 6

Descriptors: Mathematics Skills, Skill Development, Time, Models, Electronic Learning, Computation, Addition, Educational Technology, Elementary School Students

المؤلفون: Ohnishi, T., Abe, D., Abe, Y., Danjyo, R., Enokizono, A., Goke, T., Hara, M., Honda, Y., Hori, T., Ichikawa, S., Iimura, S., Ishikura, Y., Ishizaki, K., Ito, Y., Kurita, K., Legris, C., Maehara, Y., Nagano, Y., Obara, R., Ogawara, R., Suda, T., Tamae, T., Tsukada, K., Wakasugi, M., Watanabe, M., Wauke, H., Yamano, T., Yoshida, S.

المصدر: In Nuclear Inst. and Methods in Physics Research, B August 2023 541:380-384

المؤلفون: Brinkhuis, Matthieu J. S. (ORCID 0000-0003-1054-6683), Savi, Alexander O. (ORCID 0000-0002-9271-7476), Hofman, Abe D. (ORCID 0000-0003-4269-5296), Coomans, Frederik, van der Maas, Han L. J., Maris, Gunter

المصدر: Journal of Learning Analytics. 2018 5(2):29-46.

Peer Reviewed: Y

Page Count: 18

Descriptors: Data Analysis, Mathematics Instruction, Accuracy, Reaction Time, Scoring, Difficulty Level, Prediction, Item Analysis, Goodness of Fit, Achievement Gains, Mathematics Achievement, Elementary School Students, Foreign Countries, Computer Assisted Testing, Mathematics Tests, Computer Assisted Instruction, Arithmetic

مصطلحات جغرافية: Netherlands

المؤلفون: Chow, Sy-Miin^{Aff1, IDs11336021098293_cor1}, Lee, Jungmin, Hofman, Abe D., van der Maas, Han L. J., Pearl, Dennis K., Molenaar, Peter C. M.

المصدر: Psychometrika. 87(2):559-592

المؤلفون: Pressman, Abe D, Liu, Ziwei, Janzen, Evan, Blanco, Celia, Müller, Ulrich F, Joyce, Gerald F, Pascal, Robert, Chen, Irene A

المصدر: Journal of the American Chemical Society. 141(15)

مصطلحات موضوعية: Engineering, Chemical Sciences, Genetics, Acylation, Biocatalysis, Molecular Structure, Oxazolone, RNA, RNA, Catalytic, General Chemistry, Chemical sciences

URL الوصول: https://escholarship.org/uc/item/70w615ck

المؤلفون: Vikas, R., Ishihara, R., Hiroshima, Y., Abe, D., Inoue, S., Shimoda, T., Metselaar, J.W., Beenakker, C.I.M.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :919-922 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Qiu, J., Abe, D., Antonsen, T.M.Jr., Danly, B.G., Levush, B.

المصدر: IEEE MTT-S International Microwave Symposium Digest, 2003 Microwave symposium digest Microwave Symposium Digest, 2003 IEEE MTT-S International. 3:1659-1662 vol.3 2003

Relation: IEEE MTT-S International Microwave Symposium - IMS 2003