-
1
المؤلفون: Krishnendu Chakrabarty, Abhishek Koneru
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 39:3056-3066
مصطلحات موضوعية: Interconnection, Artificial neural network, Computer science, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Chip, Computer Graphics and Computer-Aided Design, Hamiltonian path, Multiplexer, 020202 computer hardware & architecture, symbols.namesake, 0202 electrical engineering, electronic engineering, information engineering, Bipartite graph, symbols, Electronic engineering, Electrical and Electronic Engineering, Software
-
2
المؤلفون: Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 38:1942-1955
مصطلحات موضوعية: Computer science, Design for testing, Transistor, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Integrated circuit, Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, law.invention, Test (assessment), law, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Range (statistics), Electrical and Electronic Engineering, Test scheduling, Software
-
3
المؤلفون: Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty, Mehdi B. Tahoori, Saman Kiamehr
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 37:1064-1075
مصطلحات موضوعية: Very-large-scale integration, Guard (information security), Engineering, business.industry, 020208 electrical & electronic engineering, Real-time computing, Workload, 02 engineering and technology, Integrated circuit, Time stress, Chip, Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, law.invention, Software, law, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, Electronic circuit
-
4
المؤلفون: Krishnendu Chakrabarty, Sukeshwar Kannan, Abhishek Koneru
المصدر: ACM Journal on Emerging Technologies in Computing Systems. 13:1-23
مصطلحات موضوعية: 010302 applied physics, Coupling, Fabrication, Materials science, Wafer bonding, business.industry, Transistor, 02 engineering and technology, Integrated circuit, Dielectric, 01 natural sciences, 020202 computer hardware & architecture, law.invention, Threshold voltage, Hardware and Architecture, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, Scaling, Software
-
5
المؤلفون: Abhishek Koneru, Krishnendu Chakrabarty
المصدر: ACM Great Lakes Symposium on VLSI
مصطلحات موضوعية: 010302 applied physics, Computer science, Design for testing, 02 engineering and technology, Integrated circuit, Fault modeling, 01 natural sciences, Die (integrated circuit), 020202 computer hardware & architecture, Reliability engineering, Test (assessment), law.invention, Built-in self-test, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Key (cryptography), Isolation (database systems)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::55431347dc8f10ae966883f9ff56409c
https://doi.org/10.1145/3299874.3319488 -
6
المؤلفون: Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty
المساهمون: Duke University [Durham], Smart Integrated Electronic Systems (SmartIES), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Department of Electrical and Computer Engineering [Durham] (ECE)
المصدر: VTS
37th VLSI Test Symposium
VTS: VLSI Test Symposium
VTS: VLSI Test Symposium, Apr 2019, Monterey, CA, United States. ⟨10.1109/VTS.2019.8758650⟩مصطلحات موضوعية: 010302 applied physics, Computer science, Genetic programming, 02 engineering and technology, High power density, 01 natural sciences, 020202 computer hardware & architecture, Reliability engineering, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Voltage droop, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Design space, Reliability model
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b6d29ce0add72e1765dc1771a3200f67
https://doi.org/10.1109/vts.2019.8758650 -
7
المؤلفون: Abhishek Koneru, Krishnendu Chakrabarty, Aida Todri-Sanial
المساهمون: Duke University [Durham], Smart Integrated Electronic Systems (SmartIES), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Department of Electrical and Computer Engineering [Durham] (ECE)
المصدر: ICECS
HAL
25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018)
25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Dec 2018, Bordeaux, France. pp.217-220, ⟨10.1109/ICECS.2018.8617951⟩مصطلحات موضوعية: 010302 applied physics, reliability, Computer science, power-supply noise, 02 engineering and technology, Integrated circuit, Co-simulation, 01 natural sciences, Noise (electronics), 020202 computer hardware & architecture, Power (physics), law.invention, Reliability (semiconductor), law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Parasitic extraction, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Routing (electronic design automation), Monolithic 3D, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7f35d25ff0f092b719feddeac8384a8b
https://doi.org/10.1109/icecs.2018.8617951 -
8
المؤلفون: Jun Zeng, Gary J. Dispoto, Qing Duan, Krishnendu Chakrabarty, Abhishek Koneru
المصدر: ACM Transactions on Design Automation of Electronic Systems. 20:1-23
مصطلحات موضوعية: Multivariate statistics, Series (mathematics), Computer science, business.industry, Univariate, Regression analysis, Machine learning, computer.software_genre, Computer Graphics and Computer-Aided Design, Computer Science Applications, Data point, Service level, Artificial intelligence, Data mining, Electrical and Electronic Engineering, Enterprise information system, business, computer, Throughput (business)
-
9
المؤلفون: Krishnendu Chakrabarty, Abhishek Koneru
المصدر: VTS
مصطلحات موضوعية: 010302 applied physics, Interconnection, Computer science, Interface (computing), Inter layer, 02 engineering and technology, Topology, 01 natural sciences, Hamiltonian path, Multiplexer, 020202 computer hardware & architecture, symbols.namesake, Built-in self-test, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, symbols, Bipartite graph, Test solution
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::45876f53592706a9b61dd2589dbeac6f
https://doi.org/10.1109/vts.2018.8368635 -
10
المؤلفون: Krishnendu Chakrabarty, Kyungwook Chang, Sung Kyu Lim, Abhishek Koneru
المصدر: ICCAD
مصطلحات موضوعية: Interconnection, Reliability (semiconductor), Process (engineering), Computer science, Hardware_INTEGRATEDCIRCUITS, 0211 other engineering and technologies, 0202 electrical engineering, electronic engineering, information engineering, Key (cryptography), Electronic design automation, 02 engineering and technology, 020202 computer hardware & architecture, 021106 design practice & management, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fd982855fa49b0c0e0a8797cc5730aeb
https://doi.org/10.1109/iccad.2017.8203860