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1مؤتمر
المؤلفون: Vyatkin, Artyom A., Abramov, Maksim V.
المصدر: 2024 XXVII International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2024 XXVII International Conference on. :41-45 May, 2024
Relation: 2024 XXVII International Conference on Soft Computing and Measurements (SCM)
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2مؤتمر
المصدر: 2024 XXVII International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2024 XXVII International Conference on. :46-48 May, 2024
Relation: 2024 XXVII International Conference on Soft Computing and Measurements (SCM)
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3مؤتمر
المؤلفون: Khlobystova, Anastasija O., Abramov, Maksim V.
المصدر: 2023 XXVI International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2023 XXVI International Conference on. :219-222 May, 2023
Relation: 2023 XXVI International Conference on Soft Computing and Measurements (SCM)
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4مؤتمر
المصدر: 2023 XXVI International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2023 XXVI International Conference on. :29-31 May, 2023
Relation: 2023 XXVI International Conference on Soft Computing and Measurements (SCM)
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5مؤتمر
المؤلفون: Abramov, Maksim V., Azarov, Artur A.
المصدر: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2017 XX IEEE International Conference on. :90-92 May, 2017
Relation: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM)
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6مؤتمر
المصدر: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2017 XX IEEE International Conference on. :93-95 May, 2017
Relation: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM)
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7مؤتمر
المؤلفون: Abramov, Maksim V., Azarov, Artur A.
المصدر: 2016 XIX IEEE International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2016 XIX IEEE International Conference on. :58-60 May, 2016
Relation: 2016 XIX IEEE International Conference on Soft Computing and Measurements (SCM)