يعرض 1 - 10 نتائج من 19 نتيجة بحث عن '"Ackaert, Jan"', وقت الاستعلام: 1.13s تنقيح النتائج
  1. 1
    مؤتمر
    Enabling backside processing for perforated microfluidic devices

    المؤلفون: Visker, Jakob, Han, Yang, Visker, Evert, Thuy, Chi Dang Thi, Gocyla, Mateusz, Humbert, Aurelie, Ackaert, Jan, Peng, Lan, Vanhaelemeersch, Serge

    المصدر: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2023 IEEE 73rd. :1266-1272 May, 2023

    Relation: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)

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  2. 2
    مؤتمر
    A novel integration scheme for wafer singulation and selective processing using temporary dry film resist

    المؤلفون: La Grappe, Alexandre, Visker, Evert, Redolfi, Augusto, Peng, Lan, Muga, Karthik, Huls, David, Vanhaelemeersch, Serge, Lauwers, Anne, Ackaert, Jan

    المصدر: 2021 IEEE 71st Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2021 IEEE 71st. :793-796 Jun, 2021

    Relation: 2021 IEEE 71st Electronic Components and Technology Conference (ECTC)

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  3. 3
    دورية أكاديمية

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  4. 4
    مؤتمر
    Metallization scheme optimization of plastic-encapsulated electronic power devices

    المؤلفون: Ackaert, Jan, Colpaert, Tony, Malik, Aditi, Gonzalez, Mario

    المصدر: 2015 International Conference on IC Design & Technology (ICICDT) IC Design & Technology (ICICDT), 2015 International Conference on. :1-4 Jun, 2015

    Relation: 2015 International Conference on IC Design & Technology (ICICDT)

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  5. 5
    مؤتمر
    Impact of the leadframe profile on the occurrence of passivation cracks of plastic-encapsulated electronic power devices

    المؤلفون: Ackaert, Jan, Mallik, Aditi, Vanderstraeten, Daniel

    المصدر: Proceedings of 2013 International Conference on IC Design & Technology (ICICDT) IC Design & Technology (ICICDT), 2013 International Conference on. :93-96 May, 2013

    Relation: 2013 International Conference on IC Design & Technology (ICICDT)

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  6. 6
    مؤتمر
    On the impact of the edge profile of interconnects on the occurrence of passivation cracks of plastic-encapsulated electronic power devices

    المؤلفون: Ackaert, Jan, Vanderstraeten, Daniel, Vandevelde, Bart

    المصدر: 2011 IEEE International Conference on IC Design & Technology IC Design & Technology (ICICDT), 2011 IEEE International Conference on. :1-4 May, 2011

    Relation: 2011 IEEE International Conference on IC Design & Technology (ICICDT)

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  7. 7
    دورية أكاديمية
    Characterization of moving bits (MBs) and QBD in wet/dry tunnel oxides for floating gate type nonvolatile memory (FG-NVM) applications

    المؤلفون: Ackaert, Jan, Lowe, Antony, Boonen, Sylvie, Yao, Thierry, Rayhem, Joseph, Desoete, Bart, Prasad, Jagdish, Thomason, Mike, Van Houdt, Jan, Degraeve, Robin, Haspeslagh, Luc, Hendrickx, Paul

    المصدر: In Solid State Electronics 2004 48(10):1911-1915

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  8. 8
    دورية أكاديمية
    Charging induced damage by photoconduction through thick inter metal dielectrics

    المؤلفون: Ackaert, Jan, Bessemans, Klara, De Backer, Eddy

    المصدر: In Microelectronics Reliability 2003 43(9):1525-1529

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  9. 9
    Dielectric engineering: Characterization, development and process damage minimization of various silicon oxides

    المؤلفون: Ackaert, Jan Germain Gabriel

    المساهمون: Kuper, F.G.

    مصطلحات موضوعية: METIS-218734, IR-41560, fungi, EWI-15712

    وصف الملف: application/pdf

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=narcis______::977a1b753e263b98b05df80d7941ade2
    https://research.utwente.nl/en/publications/dielectric-engineering(7b8fd484-8c07-4e0f-9597-57e62242cb46).html

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  10. 10
    Charging induced damage on complex-antenna test structures

    المؤلفون: Wang, Zhichun, Ackaert, Jan, Salm, Cora, Kuper, F.G.

    المصدر: Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001, 220-223
    STARTPAGE=220;ENDPAGE=223;TITLE=Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001

    مصطلحات موضوعية: METIS-200759, EWI-15639, Hardware_GENERAL, antenna structure, Hardware_INTEGRATEDCIRCUITS, metaloxide-semiconductor (MOS), metal-insulator-metalcapacitor(MIMC), Hardware_PERFORMANCEANDRELIABILITY, IR-67786, charging-induced damage (CID), Computer Science::Information Theory

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=narcis______::0b62b853d10925590ae1ebb68f30d0f5
    https://research.utwente.nl/en/publications/charging-induced-damage-on-complexantenna-test-structures(223d2c06-e7e9-4119-8151-0c9d8a25b6a9).html

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