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1مؤتمر
المؤلفون: Yeoh, Lai-Seng, del Rosario, Amalia, Tam, Chee-Wah, Chong, Kok-Cheng, Li, Susan, Adem, Ercan, Tracy, Bryan
المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :455-458 Jun, 2015
Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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2مؤتمر
المؤلفون: Adem, Ercan, Vemuri, Padma, Robie, Stephen
المصدر: 2006 IEEE International Symposium on Semiconductor Manufacturing Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on. :428-431 Sep, 2006
Relation: 2006 International Symposium on Semiconductor Manufacturing (ISSM)
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3مؤتمر
المؤلفون: Won-Chong Baek, Chowdhury, Naser, Lan Loi, Hyeon-Seag Kim, Sungjin Kim, delRosario, Amalia, Adem, Ercan, Tracy, Bryan, Pak, James
المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :EM.2.1-EM.2.5 Apr, 2012
Relation: 2012 IEEE International Reliability Physics Symposium (IRPS)
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4دورية أكاديمية
المؤلفون: MacDonald, Brian J., Paton, Eric, Adem, Ercan, En, Bill
المصدر: In Applied Surface Science 2004 231:776-780
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5دورية أكاديمية
المؤلفون: Pan, James, Woo, Christy, Van Ngo, Minh, Tracy, Bryan, Adem, Ercan, Robie, Stephen, Xiang, Qi, Lin, Ming Ren
المصدر: MRS Online Proceedings Library. 745(1)
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6دورية أكاديمية
المؤلفون: Pan, James, Woo, Christy, Ngo, Minh-Van, Chih-Yuh Yang, Minh-Van, Besser, Paul, King, Paul, Bernard, Joffre, Adem, Ercan, Tracy, Bryan, Pellerin, John, Qi Xiang, Ming-Ren Lin
المصدر: IEEE Transactions on Electron Devices; Dec2003, Vol. 50 Issue 12, p2456-2460, 5p
مصطلحات موضوعية: METAL oxide semiconductor field-effect transistors, DAMASCENING, NICKEL, COBALT, TRANSITION metals, TANTALUM
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7دورية أكاديمية
المؤلفون: Jung-Suk Goo, Qi Xiang, Takamura, Yayoi, Haihong Wang, Pan, James, Arasnia, Farzad, Paton, Eric N., Besser, Paul, Sidorov, Maxim V., Adem, Ercan, Lochtefeld, Anthony, Braithwaite, Glyn, Currie, Matthew T., Hammond, Richard, Bulsara, Mayank T., Ming-Ren Lin
المصدر: IEEE Electron Device Letters; May2003, Vol. 24 Issue 5, p351, 3p, 1 Black and White Photograph, 3 Graphs
مصطلحات موضوعية: METAL oxide semiconductor field-effect transistors, ELECTRONICS
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8
المؤلفون: Adem, Ercan H
المساهمون: Pattinson, EB
مصطلحات موضوعية: QC
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=core_ac_uk__::f4d3446d9d55b76ab8c28d004875da96
https://eprints.keele.ac.uk/7329/1/AdemPhD1985.pdf -
9مؤتمر
المؤلفون: Bernard, Joffre, Adem, Ercan, Ramaswami, Seshadri
المصدر: MRS Online Proceedings Library; 01/21/1993, Vol. 318, pN.PAG-1, 1p
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10مؤتمر
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