المؤلفون: Yeoh, Lai-Seng, del Rosario, Amalia, Tam, Chee-Wah, Chong, Kok-Cheng, Li, Susan, Adem, Ercan, Tracy, Bryan

المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :455-458 Jun, 2015

Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Adem, Ercan, Vemuri, Padma, Robie, Stephen

المصدر: 2006 IEEE International Symposium on Semiconductor Manufacturing Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on. :428-431 Sep, 2006

Relation: 2006 International Symposium on Semiconductor Manufacturing (ISSM)

المؤلفون: Won-Chong Baek, Chowdhury, Naser, Lan Loi, Hyeon-Seag Kim, Sungjin Kim, delRosario, Amalia, Adem, Ercan, Tracy, Bryan, Pak, James

المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :EM.2.1-EM.2.5 Apr, 2012

Relation: 2012 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: MacDonald, Brian J., Paton, Eric, Adem, Ercan, En, Bill

المصدر: In Applied Surface Science 2004 231:776-780

المؤلفون: Pan, James, Woo, Christy, Van Ngo, Minh, Tracy, Bryan, Adem, Ercan, Robie, Stephen, Xiang, Qi, Lin, Ming Ren

المصدر: MRS Online Proceedings Library. 745(1)

المؤلفون: Pan, James, Woo, Christy, Ngo, Minh-Van, Chih-Yuh Yang, Minh-Van, Besser, Paul, King, Paul, Bernard, Joffre, Adem, Ercan, Tracy, Bryan, Pellerin, John, Qi Xiang, Ming-Ren Lin

المصدر: IEEE Transactions on Electron Devices; Dec2003, Vol. 50 Issue 12, p2456-2460, 5p

مصطلحات موضوعية: METAL oxide semiconductor field-effect transistors, DAMASCENING, NICKEL, COBALT, TRANSITION metals, TANTALUM

المؤلفون: Jung-Suk Goo, Qi Xiang, Takamura, Yayoi, Haihong Wang, Pan, James, Arasnia, Farzad, Paton, Eric N., Besser, Paul, Sidorov, Maxim V., Adem, Ercan, Lochtefeld, Anthony, Braithwaite, Glyn, Currie, Matthew T., Hammond, Richard, Bulsara, Mayank T., Ming-Ren Lin

المصدر: IEEE Electron Device Letters; May2003, Vol. 24 Issue 5, p351, 3p, 1 Black and White Photograph, 3 Graphs

مصطلحات موضوعية: METAL oxide semiconductor field-effect transistors, ELECTRONICS

المؤلفون: Adem, Ercan H

المساهمون: Pattinson, EB

مصطلحات موضوعية: QC

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=core_ac_uk__::f4d3446d9d55b76ab8c28d004875da96
https://eprints.keele.ac.uk/7329/1/AdemPhD1985.pdf

المؤلفون: Bernard, Joffre, Adem, Ercan, Ramaswami, Seshadri

المصدر: MRS Online Proceedings Library; 01/21/1993, Vol. 318, pN.PAG-1, 1p

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