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1مؤتمر
المؤلفون: Aftabjahani, Sohrab, Tehranipoor, Mark, Farahmandi, Farimah, Ahmed, Bulbul, Kastner, Ryan, Restuccia, Francesco, Meza, Andres, Ryan, Kaki, Fern, Nicole, van Woudenberg, Jasper, Velegalati, Rajesh, Breunesse, Cees-Bart, Sturton, Cynthia, Deutschbein, Calvin
المصدر: 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-10 Apr, 2023
Relation: 2023 IEEE 41st VLSI Test Symposium (VTS)
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2مؤتمرHardware and Energy Efficiency Evaluation of NIST Lightweight Cryptography Standardization Finalists
المؤلفون: Elsadek, Islam, Aftabjahani, Sohrab, Gardner, Doug, MacLean, Erik, Wallrabenstein, John Ross, Tawfik, Eslam Yahya
المصدر: 2022 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2022 IEEE International Symposium on. :133-137 May, 2022
Relation: 2022 IEEE International Symposium on Circuits and Systems (ISCAS)
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3مؤتمر
المؤلفون: Elsadek, Islam, Aftabjahani, Sohrab, Gardner, Doug, MacLean, Erik, Wallrabenstein, John Ross, Tawfik, Eslam Yahya
المصدر: 2022 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2022 IEEE International Symposium on. :138-141 May, 2022
Relation: 2022 IEEE International Symposium on Circuits and Systems (ISCAS)
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4مؤتمر
المؤلفون: Talukdar, Jonti, Chen, Siyuan, Das, Amitabh, Aftabjahani, Sohrab, Song, Peilin, Chakrabarty, Krishnendu
المصدر: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :170-179 Oct, 2021
Relation: 2021 IEEE International Test Conference (ITC)
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5مؤتمر
المؤلفون: Aftabjahani, Sohrab, Kastner, Ryan, Tehranipoor, Mark, Farahmandi, Farimah, Oberg, Jason, Nordstrom, Anders, Fern, Nicole, Althoff, Alric
المصدر: 2021 IEEE 39th VLSI Test Symposium (VTS) Test Symposium (VTS), 2021 IEEE 39th VLSI. :1-10 Apr, 2021
Relation: 2021 IEEE 39th VLSI Test Symposium (VTS)
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6مؤتمر
المؤلفون: Abadir, Magdy, Aftabjahani, Sohrab
المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-2 Nov, 2019
Relation: 2019 IEEE International Test Conference (ITC)
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7مؤتمر
المؤلفون: Abadir, Magdy, Aftabjahani, Sohrab
المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-2 Nov, 2019
Relation: 2019 IEEE International Test Conference (ITC)
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8مؤتمر
المؤلفون: Aftabjahani, Sohrab, Oberg, Jason, Chen, Michael, Li, Huawei
المصدر: 2018 IEEE 36th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2018 IEEE 36th. :1-1 Apr, 2018
Relation: 2018 IEEE 36th VLSI Test Symposium (VTS)
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