المؤلفون: Huh, Hwang, Cho, Wanik, Lee, Jinhaeng, Noh, Yujong, Park, Yongsoon, Ok, Sunghwa, Kim, Jongwoo, Cho, Kayoung, Lee, Hyunchul, Kim, Geonu, Park, Kangwoo, Kim, Kwanho, Lee, Heejoo, Chai, Sooyeol, Kwon, Chankeun, Cho, Hanna, Jeong, Chanhui, Yang, Yujin, Goo, Jayoon, Park, Jangwon, Lee, Juhyeong, Kirr, Heonki, Jo, Kangwook, Park, Cheoljoong, Nam, Hyeonsu, Song, Hyunseok, Lee, Sangkyu, Jeong, Woopyo, Ahn, Kun-Ok, Jung, Tae-Sung

المصدر: 2020 IEEE International Solid-State Circuits Conference - (ISSCC) Solid-State Circuits Conference - (ISSCC), 2020 IEEE International. :220-221 Feb, 2020

Relation: 2020 IEEE International Solid-State Circuits Conference - (ISSCC)

المؤلفون: Park, Jin-Su, You, Byoung-Sung, Lee, Sang-Don, Baek, Kwang-ho, Jeon, Chun-Woo, Kang, Tai-kyu, Lee, Jae-Ho, Kim, Min-su, Choi, Dae-il, Choi, Jae-won, Jeong, Hyun, Kim, Jong-woo, Jang, Eun-seong, Kim, Tae-Yun, Lee, Chang-Hyuk, Nam, Jong-Gi, Han, Bong-Seok, Ahn, Kun-Ok, Bae, Ki-hyun

المصدر: 2012 IEEE Asian Solid State Circuits Conference (A-SSCC) Solid State Circuits Conference (A-SSCC), 2012 IEEE Asian. :17-20 Dec, 2012

Relation: 2012 IEEE Asian Solid State Circuits Conference (A-SSCC)

المؤلفون: Park, Byoungjun, Cho, Sunghoon, Park, Milim, Park, Sukkwang, Lee, Yunbong, Cho, Myoung Kwan, Ahn, Kun-Ok, Bae, Gihyun, Park, Sungwook

المصدر: 2012 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2012 IEEE International Symposium on. :420-423 May, 2012

Relation: 2012 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Park, Byoungjun, Cho, Sunghoon, Park, Jiyul, Kim, Pyunghwa, Lee, Sangjo, Park, Milim, Park, Min Sang, Park, Sukkwang, Yang, Hae Chang, Park, Sungjo, Lee, Yunbong, Cho, Myoung Kwan, Ahn, Kun-Ok, Bae, Gihyun, Park, Sungwook

المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-4 May, 2012

Relation: 2012 4th IEEE International Memory Workshop (IMW)

المؤلفون: Jeong, YeonJoo, Lee, Sangjo, Cho, Sunghoon, Kim, Pyunghwa, Park, Milim, Lee, SungPyo, Shim, Hyunyoung, Cho, Myoung Kwan, Ahn, Kun-Ok, Bae, Gihyun, Park, Sungwook

المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-3 May, 2012

Relation: 2012 4th IEEE International Memory Workshop (IMW)

المؤلفون: Kim, Sungho, Lee, Myeongwon, Choi, Gil-Bok, Lee, Jaekwan, Lee, Yunbong, Cho, Myoungkwan, Ahn, Kun-Ok, Kim, Jinwoong

المصدر: 2015 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2015 IEEE International. :MY.8.1-MY.8.4 Apr, 2015

Relation: 2015 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Shim, Hyunyoung, Lee, Seaung-Suk, Kim, Byungkook, Lee, Namjae, Kim, Doyoung, Kim, Hankyum, Ahn, Byungkeun, Hwang, Youngho, Lee, Hoseok, Kim, Jumsoo, Lee, Youngbok, Lee, Heeyoul, Lee, Juyeab, Chang, Seungho, Yang, Joongseob, Park, Sungkye, Aritome, Seiichi, Lee, Seokkiu, Ahn, Kun-Ok, Bae, Gihyun, Yang, Yeseok

المصدر: 2011 Symposium on VLSI Technology - Digest of Technical Papers VLSI Technology (VLSIT), 2011 Symposium on. :216-217 Jun, 2011

Relation: 2011 IEEE Symposium on VLSI Technology

المؤلفون: Lee, Dong Wook, Cho, Sunghoon, Kang, Byung Woo, Park, Sukkwang, Park, Byoungjun, Cho, Myoung Kwan, Ahn, Kun-Ok, Yang, Ye Seok, Park, Sung Wook

المصدر: 2011 3rd IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2011 3rd IEEE International. :1-2 May, 2011

Relation: 2011 3rd IEEE International Memory Workshop (IMW)

المؤلفون: Lee, Yunbong, Park, Byoungjun, Yun, DaeHwan, Jeong, YeonJoo, Kim, Pyoung Hwa, Park, Ji Yul, Yang, Hae chang, Cho, Myoung Kwan, Ahn, Kun-Ok, Yohwan Koh

المصدر: 2010 IEEE International Memory Workshop Memory Workshop (IMW), 2010 IEEE International. :1-2 May, 2010

Relation: 2010 IEEE International Memory Workshop (IMW)

المؤلفون: Park, Milim, Park, Sukkwang, Cho, Seokwon, Lee, Dong-Kyu, Jeong, YeonJoo, Hong, Chonga, Lee, Ho Seok, Cho, Myoung Kwan, Ahn, Kun-Ok, Koh, Yohwan

المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :975-976 May, 2010

Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)