المؤلفون: Teemu Kääriäinen, Priit Jaanson, Aigar Vaigu, Rami Mannila, Albert Manninen

المصدر: Sensors, Vol 19, Iss 9, p 2192 (2019)

مصطلحات موضوعية: hyperspectral, lidar, remote sensing, supercontinuum, FPI, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/19/9/2192; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/25d6b565c2aa4a1ebd5107a2733c227d

المؤلفون: Geiland Porrovecchio, Vahid Sandoghdar, Xiao Liu Chu, Aigar Vaigu, Christoph Becher, Stephan Götzinger, Marek Smid, Sarah Lindner, Albert Manninen, Erkki Ikonen

المصدر: Vaigu, A, Porrovecchio, G, Chu, X-L, Lindner, S, Smid, M, Manninen, A, Becher, C, Sandoghdar, V, Götzinger, S & Ikonen, E 2017, ' Experimental demonstration of a predictable single photon source with variable photon flux ', Metrologia, vol. 54, no. 2, pp. 218-223 . https://doi.org/10.1088/1681-7575/aa5ba2

مصطلحات موضوعية: Silicon, Physics::Instrumentation and Detectors, Physics::Optics, chemistry.chemical_element, Flux, 01 natural sciences, 010309 optics, Responsivity, Optics, Vacancy defect, single photon sources, 0103 physical sciences, 010306 general physics, silicon vacancy centrer, Physics, low optical flux detector, business.industry, Detector, General Engineering, chemistry, Excited state, Single-photon source, photon on demand, Optoelectronics, business, single photon metrology, Excitation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1e2e21bfdd03c062ce2221a43b0624fe
https://doi.org/10.1088/1681-7575/aa5ba2

المؤلفون: M. López, N. Castagna, Ivo Pietro Degiovanni, Aigar Vaigu, Geiland Porrovecchio, R. A. Kirkwood, Christopher J. Chunnilall, Andrei Pokatilov, J. Morel, I. Ruo Berchera, Marco Gramegna, Farshid Manoocheri, S. Kueck, Toomas Kübarsepp

المساهمون: INRiM, Physikalisch-Technische Bundesanstalt, Czech Metrology Institute, National Physical Laboratory, AS Metrosert, Swiss Federal Institute for Metrology, Dept Signal Process and Acoust, VTT Technical Research Centre of Finland, Aalto-yliopisto, Aalto University

المصدر: Gramegna, M, Ruo Berchera, I, Kueck, S, Porrovecchio, G, Chunnilall, C J, Degiovanni, I P, Lopez, M, Kirkwood, R A, Kübarsepp, T, Pokatilov, A, Castagna, N, Morel, J, Manoocheri, F & Vaigu, A 2018, European coordinated metrological effort for quantum cryptography . in Quantum Technologies 2018 ., 106741K, International Society for Optics and Photonics SPIE, Proceedings of SPIE, vol. 10674, Quantum Technologies 2018, Strasbourg, France, 23/04/18 . https://doi.org/10.1117/12.2307841

مصطلحات موضوعية: Computer science, Distributed computing, Quantum Key Distribution, Cryptography, 02 engineering and technology, Quantum entanglement, Quantum channel, Quantum key distribution, Metrology, 01 natural sciences, Secure communication, Quantum state, 0103 physical sciences, Quantum Communication, 010306 general physics, Quantum information science, Quantum, Quantum computer, Computer Science::Cryptography and Security, ta213, ta114, business.industry, TheoryofComputation_GENERAL, Single-Photon Sources, 021001 nanoscience & nanotechnology, Quantum technology, Quantum cryptography, ComputerSystemsOrganization_MISCELLANEOUS, Key (cryptography), 0210 nano-technology, business

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1762f64333730c65bcac1a4385bf140b
https://cris.vtt.fi/en/publications/4802449d-4a9d-464b-80ee-4c8a772c7493

المؤلفون: Maria Luisa Rastello, Alberto Tosi, Fabrizio Piacentini, Alice Meda, Christopher J. Chunnilall, Ivo Pietro Degiovanni, Paolo Traina, Geiland Porrovecchio, Toomas Kübarsepp, Giorgio Brida, Kee-Suk Hong, Seung Kwan Kim, Alistar G. Sinclair, A.Al. Natsheh, Farshid Manoocheri, Aigar Vaigu, Stefan Kück, Ingmar Müller, Roman Klein, Jessica Y. Cheung, Erkki Ikonen, Marek Smid, Damien Stucki

المصدر: Metrologia. 51:S267-S275

مصطلحات موضوعية: EFFICIENCY, Metrology, Quantum communication, Quantum cryptography, Engineering (all), sezele, RANDOM NUMBER GENERATOR, PHOTON-BASED METHOD, CRYPTOGRAPHY, UNCERTAINTY, RADIATION, VACUUM, RANGE, Standardization, Computer science, Nanotechnology, Quantum channel, Quantum key distribution, Quantum state, Quantum information science, Quantum, business.industry, General Engineering, Macroscopic quantum phenomena, Telecommunications, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::483d7e4880e57c5c41e772bbaa8d03b4
https://doi.org/10.1088/0026-1394/51/6/s267

المؤلفون: M. Merimaa, Toomas Kübarsepp, Farshid Manoocheri, Erkki Ikonen, Aigar Vaigu

المصدر: Vaigu, A, Kübarsepp, T, Manoocheri, F, Merimaa, M & Ikonen, E 2015, ' Compact two-element transmission trap detector for 1550 nm wavelength ', Measurement Science and Technology, vol. 26, no. 5, pp. 1-6 . https://doi.org/10.1088/0957-0233/26/5/055901

مصطلحات موضوعية: InGaAs, Physics::Instrumentation and Detectors, 9 mm caliber, Photodetector, Metrology, law.invention, Responsivity, Optics, law, Instrumentation, Engineering (miscellaneous), Transmission trap detector, Physics, business.industry, Applied Mathematics, Detector, Photodetectors, Linearity, Polarization insensitive detector, Polarization (waves), Photodiode, Wavelength, Trap detector, business, Infrared

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::81700c451563a6fe11b2cd9429a8fdcb
https://cris.vtt.fi/en/publications/e147a620-9bf4-4700-8a99-0f5fe373862c

المؤلفون: Erkki Ikonen, Aigar Vaigu, Marek Smid, Sarah Lindner, Vahid Sandoghdar, Christoph Becher, Albert Manninen, Stephan Götzinger, Geiland Porrovecchio, Xiao-Liu Chu

المصدر: Metrologia. 54:417-417

مصطلحات موضوعية: Physics, Optics, business.industry, Single-photon source, General Engineering, Photon flux, business, Variable (mathematics), Computational physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b27e5f7ed3e0b72b7d77bb0a2dd3631d
https://doi.org/10.1088/1681-7575/aa7149

المؤلفون: Aigar Vaigu, Geiland Porrovecchio, Xiao-Liu Chu, Sarah Lindner, Marek Smid, Albert Manninen, Christoph Becher, Vahid Sandoghdar, Stephan Götzinger, Erkki Ikonen

المصدر: Metrologia; Jun2017, Vol. 54 Issue 3, p1-1, 1p

المؤلفون: Aigar Vaigu, Geiland Porrovecchio, Xiao-Liu Chu, Sarah Lindner, Marek Smid, Albert Manninen, Christoph Becher, Vahid Sandoghdar, Stephan Götzinger, Erkki Ikonen

المصدر: Metrologia; Apr2017, Vol. 54 Issue 2, p1-1, 1p

المؤلفون: Aigar Vaigu, Toomas Kübarsepp, Farshid Manoocheri, Mikko Merimaa, Erkki Ikonen

المصدر: Measurement Science & Technology; May2015, Vol. 26 Issue 5, p1-1, 1p

مصطلحات موضوعية: DETECTORS, WAVELENGTHS, PHOTODIODES, POLARIZATION (Electricity), METROLOGY, REFLECTANCE