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1دورية أكاديمية
المؤلفون: Teemu Kääriäinen, Priit Jaanson, Aigar Vaigu, Rami Mannila, Albert Manninen
المصدر: Sensors, Vol 19, Iss 9, p 2192 (2019)
مصطلحات موضوعية: hyperspectral, lidar, remote sensing, supercontinuum, FPI, Chemical technology, TP1-1185
وصف الملف: electronic resource
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2
المؤلفون: Geiland Porrovecchio, Vahid Sandoghdar, Xiao Liu Chu, Aigar Vaigu, Christoph Becher, Stephan Götzinger, Marek Smid, Sarah Lindner, Albert Manninen, Erkki Ikonen
المصدر: Vaigu, A, Porrovecchio, G, Chu, X-L, Lindner, S, Smid, M, Manninen, A, Becher, C, Sandoghdar, V, Götzinger, S & Ikonen, E 2017, ' Experimental demonstration of a predictable single photon source with variable photon flux ', Metrologia, vol. 54, no. 2, pp. 218-223 . https://doi.org/10.1088/1681-7575/aa5ba2
مصطلحات موضوعية: Silicon, Physics::Instrumentation and Detectors, Physics::Optics, chemistry.chemical_element, Flux, 01 natural sciences, 010309 optics, Responsivity, Optics, Vacancy defect, single photon sources, 0103 physical sciences, 010306 general physics, silicon vacancy centrer, Physics, low optical flux detector, business.industry, Detector, General Engineering, chemistry, Excited state, Single-photon source, photon on demand, Optoelectronics, business, single photon metrology, Excitation
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3
المؤلفون: M. López, N. Castagna, Ivo Pietro Degiovanni, Aigar Vaigu, Geiland Porrovecchio, R. A. Kirkwood, Christopher J. Chunnilall, Andrei Pokatilov, J. Morel, I. Ruo Berchera, Marco Gramegna, Farshid Manoocheri, S. Kueck, Toomas Kübarsepp
المساهمون: INRiM, Physikalisch-Technische Bundesanstalt, Czech Metrology Institute, National Physical Laboratory, AS Metrosert, Swiss Federal Institute for Metrology, Dept Signal Process and Acoust, VTT Technical Research Centre of Finland, Aalto-yliopisto, Aalto University
المصدر: Gramegna, M, Ruo Berchera, I, Kueck, S, Porrovecchio, G, Chunnilall, C J, Degiovanni, I P, Lopez, M, Kirkwood, R A, Kübarsepp, T, Pokatilov, A, Castagna, N, Morel, J, Manoocheri, F & Vaigu, A 2018, European coordinated metrological effort for quantum cryptography . in Quantum Technologies 2018 ., 106741K, International Society for Optics and Photonics SPIE, Proceedings of SPIE, vol. 10674, Quantum Technologies 2018, Strasbourg, France, 23/04/18 . https://doi.org/10.1117/12.2307841
مصطلحات موضوعية: Computer science, Distributed computing, Quantum Key Distribution, Cryptography, 02 engineering and technology, Quantum entanglement, Quantum channel, Quantum key distribution, Metrology, 01 natural sciences, Secure communication, Quantum state, 0103 physical sciences, Quantum Communication, 010306 general physics, Quantum information science, Quantum, Quantum computer, Computer Science::Cryptography and Security, ta213, ta114, business.industry, TheoryofComputation_GENERAL, Single-Photon Sources, 021001 nanoscience & nanotechnology, Quantum technology, Quantum cryptography, ComputerSystemsOrganization_MISCELLANEOUS, Key (cryptography), 0210 nano-technology, business
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1762f64333730c65bcac1a4385bf140b
https://cris.vtt.fi/en/publications/4802449d-4a9d-464b-80ee-4c8a772c7493 -
4
المؤلفون: Maria Luisa Rastello, Alberto Tosi, Fabrizio Piacentini, Alice Meda, Christopher J. Chunnilall, Ivo Pietro Degiovanni, Paolo Traina, Geiland Porrovecchio, Toomas Kübarsepp, Giorgio Brida, Kee-Suk Hong, Seung Kwan Kim, Alistar G. Sinclair, A.Al. Natsheh, Farshid Manoocheri, Aigar Vaigu, Stefan Kück, Ingmar Müller, Roman Klein, Jessica Y. Cheung, Erkki Ikonen, Marek Smid, Damien Stucki
المصدر: Metrologia. 51:S267-S275
مصطلحات موضوعية: EFFICIENCY, Metrology, Quantum communication, Quantum cryptography, Engineering (all), sezele, RANDOM NUMBER GENERATOR, PHOTON-BASED METHOD, CRYPTOGRAPHY, UNCERTAINTY, RADIATION, VACUUM, RANGE, Standardization, Computer science, Nanotechnology, Quantum channel, Quantum key distribution, Quantum state, Quantum information science, Quantum, business.industry, General Engineering, Macroscopic quantum phenomena, Telecommunications, business
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5
المؤلفون: M. Merimaa, Toomas Kübarsepp, Farshid Manoocheri, Erkki Ikonen, Aigar Vaigu
المصدر: Vaigu, A, Kübarsepp, T, Manoocheri, F, Merimaa, M & Ikonen, E 2015, ' Compact two-element transmission trap detector for 1550 nm wavelength ', Measurement Science and Technology, vol. 26, no. 5, pp. 1-6 . https://doi.org/10.1088/0957-0233/26/5/055901
مصطلحات موضوعية: InGaAs, Physics::Instrumentation and Detectors, 9 mm caliber, Photodetector, Metrology, law.invention, Responsivity, Optics, law, Instrumentation, Engineering (miscellaneous), Transmission trap detector, Physics, business.industry, Applied Mathematics, Detector, Photodetectors, Linearity, Polarization insensitive detector, Polarization (waves), Photodiode, Wavelength, Trap detector, business, Infrared
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::81700c451563a6fe11b2cd9429a8fdcb
https://cris.vtt.fi/en/publications/e147a620-9bf4-4700-8a99-0f5fe373862c -
6
المؤلفون: Erkki Ikonen, Aigar Vaigu, Marek Smid, Sarah Lindner, Vahid Sandoghdar, Christoph Becher, Albert Manninen, Stephan Götzinger, Geiland Porrovecchio, Xiao-Liu Chu
المصدر: Metrologia. 54:417-417
مصطلحات موضوعية: Physics, Optics, business.industry, Single-photon source, General Engineering, Photon flux, business, Variable (mathematics), Computational physics
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7دورية أكاديمية
المؤلفون: Aigar Vaigu, Geiland Porrovecchio, Xiao-Liu Chu, Sarah Lindner, Marek Smid, Albert Manninen, Christoph Becher, Vahid Sandoghdar, Stephan Götzinger, Erkki Ikonen
المصدر: Metrologia; Jun2017, Vol. 54 Issue 3, p1-1, 1p
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8دورية أكاديمية
المؤلفون: Aigar Vaigu, Geiland Porrovecchio, Xiao-Liu Chu, Sarah Lindner, Marek Smid, Albert Manninen, Christoph Becher, Vahid Sandoghdar, Stephan Götzinger, Erkki Ikonen
المصدر: Metrologia; Apr2017, Vol. 54 Issue 2, p1-1, 1p
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9دورية أكاديمية
المؤلفون: Aigar Vaigu, Toomas Kübarsepp, Farshid Manoocheri, Mikko Merimaa, Erkki Ikonen
المصدر: Measurement Science & Technology; May2015, Vol. 26 Issue 5, p1-1, 1p
مصطلحات موضوعية: DETECTORS, WAVELENGTHS, PHOTODIODES, POLARIZATION (Electricity), METROLOGY, REFLECTANCE