المؤلفون: Katti, Prabodh, Nimbekar, Anagha, Li, Chen, Acharyya, Amit, Al-Hashimi, Bashir M., Rajendran, Bipin

المصدر: 2024 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2024 IEEE International Symposium on. :1-5 May, 2024

Relation: 2024 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Katti, Prabodh, Skatchkovsky, Nicolas, Simeone, Osvaldo, Rajendran, Bipin, Al-Hashimi, Bashir M.

المصدر: 2023 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2023 IEEE International Symposium on. :1-5 May, 2023

Relation: 2023 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Rajendran, Bipin, Simeone, Osvaldo, Al-Hashimi, Bashir M.

مصطلحات موضوعية: Computer Science - Artificial Intelligence, Computer Science - Emerging Technologies, Computer Science - Information Theory

URL الوصول: http://arxiv.org/abs/2309.15942

المؤلفون: Isuwa, Samuel, Amos, David, Singh, Amit Kumar, Al-Hashimi, Bashir M., Merrett, Geoff V.

المصدر: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-2 Apr, 2023

Relation: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Xun, Lei, Al-Hashimi, Bashir M., Hare, Jonathon, Merrett, Geoff V.

مصطلحات موضوعية: Computer Science - Hardware Architecture

URL الوصول: http://arxiv.org/abs/2206.02525

المؤلفون: Xun, Lei, Tran-Thanh, Long, Al-Hashimi, Bashir M, Merrett, Geoff V.

المصدر: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). :1556-1561 Mar, 2020

Relation: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Xun, Lei, Tran-Thanh, Long, Al-Hashimi, Bashir M, Merrett, Geoff V.

المصدر: 2019 ACM/IEEE 1st Workshop on Machine Learning for CAD (MLCAD) Machine Learning for CAD (MLCAD), 2019 ACM/IEEE 1st Workshop on. :1-6 Sep, 2019

Relation: 2019 ACM/IEEE 1st Workshop on Machine Learning for CAD (MLCAD)

المؤلفون: Xun, Lei, Tran-Thanh, Long, Al-Hashimi, Bashir M, Merrett, Geoff V.

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2105.03608

المؤلفون: Xun, Lei, Tran-Thanh, Long, Al-Hashimi, Bashir M, Merrett, Geoff V.

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2105.03600

المؤلفون: Tenentes, Vasileios, Das, Shidhartha, Rossi, Daniele, Al-Hashimi, Bashir M.

المصدر: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS ), 2019 IEEE 25th International Symposium on. :275-280 Jul, 2019

Relation: 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)