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1مؤتمر
المؤلفون: Alamin, Khaled Sidahmed Sidahmed, Chen, Yukai, Macii, Enrico, Poncino, Massimo, Vinco, Sara
المصدر: 2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), 2023 AEIT International Conference on. :1-6 Jul, 2023
Relation: 2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE)
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2تقرير
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3مؤتمر
المؤلفون: Alamin, Khaled Sidahmed Sidahmed, Chen, Yukai, Macii, Enrico, Poncino, Massimo, Vinco, Sara
المصدر: 2022 IEEE International Conference on Omni-layer Intelligent Systems (COINS) Omni-layer Intelligent Systems (COINS), 2022 IEEE International Conference on. :1-6 Aug, 2022
Relation: 2022 IEEE International Conference on Omni-layer Intelligent Systems (COINS)
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4
المؤلفون: Alamin, KHALED SIDAHMED SIDAHMED, Chen, Yukai, Sebastiano, Gaiardelli, Stefano, Spellini, Calimera, Andrea, Beghi, Alessandro, Antonio, Susto, Fummi, Franco, Macii, Enrico, Vinco, Sara
مصطلحات موضوعية: semiconductor manufacturing, predictive maintenance, anomaly detection, machine learning, semiconductor dataset, industry 4.0, Manufacturing Execution System
URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______2153::b2b8367503fdaae225c7e79cb8ee88b2
http://hdl.handle.net/11583/2970802 -
5دورية أكاديمية
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