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المؤلفون: Ruchil Jain, Felix Holzmueller, Peter Baars, Alban Zaka, Elodie Ebrard, Ketankumar Tailor, Tom Herrmann, Damien Angot
المصدر: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7ae6e905ed20f151dfc98f0724948e5b
https://doi.org/10.1109/ispsd49238.2022.9813636 -
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المؤلفون: Tom Herrmann, Alban Zaka, Zhixing Zhao, Binit Syamal, Wafa Arfaoui, Ruchil Jain, Ming-Cheng Chang, Sameer Jain, Shih Ni Ong
المصدر: Solid-State Electronics. 199:108512
مصطلحات موضوعية: Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
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المؤلفون: D. Lipp, Y. Raffel, A. Jayakumar, R. Olivo, R. Pfuetzner, R. Illgen, A. Muehlhoff, Jan Hoentschel, L. Pirro, Michael Otto, O. Zimmerhackl, Alban Zaka, Konrad Seidel
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Surface (mathematics), Materials science, Silicon, business.industry, Noise reduction, Transistor, chemistry.chemical_element, 01 natural sciences, Noise (electronics), law.invention, Reliability (semiconductor), chemistry, law, Logic gate, 0103 physical sciences, Optoelectronics, business, Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54120bc6f07b89a11389b90cbb78b2d2
https://doi.org/10.1109/irps46558.2021.9405122 -
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المؤلفون: Luca- Pirro, Alban Zaka, Tom Hermann, Martin Majer, Jan Hoentschel
المصدر: Extended Abstracts of the 2020 International Conference on Solid State Devices and Materials.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0e605a6a66681e5aabc53ef96a347edc
https://doi.org/10.7567/ssdm.2020.a-3-02 -
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المؤلفون: Tom Herrmann, Alban Zaka, Stefan Duenkel, R.K. Jain, Ralf Richter
المصدر: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
مصطلحات موضوعية: Flash (photography), Focus (computing), Computer science, Electronic engineering, Figure of merit, Hardware_PERFORMANCEANDRELIABILITY, Transient (oscillation), Flash memory, Hot-carrier injection
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::aa939eb8e4ec0a22e3eb174dec63f358
https://doi.org/10.23919/sispad49475.2020.9241647 -
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المؤلفون: Xinwang Liu, Tom Herrmann, G. Festes, B. Bertello, Yuri Tkachev, Boris Bayha, M. Duggan, Ralf Richter, Alban Zaka, Decobert Catherine, Thomas Melde, S. Wittek, Stefan Dunkel, N. Do, P. Ghazav, N. Bollon, F. Mauersberger, Sven Beyer, Kim Jinho, Viktor Markov, B. Muller, Zhou Feng, S. Jourba, M. Trentzsch
المصدر: 2020 IEEE International Memory Workshop (IMW).
مصطلحات موضوعية: 010302 applied physics, Computer science, business.industry, Transistor, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, law.invention, Flash (photography), Reliability (semiconductor), CMOS, Memory cell, law, 0103 physical sciences, Process integration, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Data retention, Metal gate, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::68d6b99bb8692b55d9511f87f7674fd4
https://doi.org/10.1109/imw48823.2020.9108118 -
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المؤلفون: Vishal Ganesan, Tom Herrmann, Sagar P Karalkar, Kyongjin Hwang, Bhoopendra Singh, Sevashanmugam Marimuthu, Robert Gauthier, Alban Zaka
المصدر: IRPS
مصطلحات موضوعية: Reliability (semiconductor), Electrostatic discharge, Materials science, CMOS, business.industry, Electric field, Electrical engineering, Self protection, High voltage cmos technology, business, NMOS logic, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0bffd0b13d89fdb179c1443b8cf42e25
https://doi.org/10.1109/irps45951.2020.9129515 -
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المؤلفون: Klaus Hempel, R. Taylor, Tianbing Chen, Alexis Divay, Tom Herrmann, Alban Zaka, Patrick James Artz, Yogadissen Andee, Steffen Lehmann, L. Pirro, Zhixing Zhao, Carsten Grass, Jan Hoentschel, Ricardo Sousa, Juergen Faul, David Harame, J. Mazurier, Luca Lucci
المصدر: ESSDERC
مصطلحات موضوعية: 010302 applied physics, Materials science, Boosting (machine learning), business.industry, Transconductance, Gate resistance, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, Reduction (complexity), Parasitic capacitance, 0103 physical sciences, MOSFET, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Parasitic extraction, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bff08f1a388899bb2e0e1a09eac0394e
https://doi.org/10.1109/essderc.2019.8901693 -
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المؤلفون: Yogadissen Andee, Tom Herrmann, Alban Zaka, Zhixing Zhao, Nandha Kumar Subramani, Steffen Lehmann
المصدر: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
مصطلحات موضوعية: 010302 applied physics, Computer science, Process (computing), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Capacitance, Stress (mechanics), Logic gate, 0103 physical sciences, Electronic engineering, Calibration, Figure of merit, Radio frequency, Performance improvement, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::242bd46ea3339354d560a1a4a41af5b8
https://doi.org/10.1109/sispad.2019.8870435 -
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المؤلفون: Tom Herrmann, Maximilian Juttner, Tim Seiler, W. Klix, R. Stenzel, Alban Zaka, Jan Hoentschel, L. Pirro
المصدر: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
مصطلحات موضوعية: 010302 applied physics, Materials science, 010308 nuclear & particles physics, Transistor, Biasing, Mixed-signal integrated circuit, 01 natural sciences, Noise (electronics), Power (physics), law.invention, CMOS, Power consumption, law, 0103 physical sciences, Electronic engineering, Double gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::52482f6b576241ceb295e96ecffe7eda
https://doi.org/10.1109/eurosoi-ulis45800.2019.9041889