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1دورية أكاديمية
المؤلفون: Alexandre Mercat, Arttu Makinen, Joose Sainio, Ari Lemmetti, Marko Viitanen, Jarno Vanne
المصدر: IEEE Access, Vol 9, Pp 67813-67828 (2021)
مصطلحات موضوعية: Common test conditions (CTC), HEVC test model (HM), high efficiency video coding (HEVC), objective quality analysis, performance profiling, rate-distortion-complexity (RDC), Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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المؤلفون: Joose Sainio, Alexandre Mercat, Jarno Vanne
المصدر: ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::926d66d4090308eea4296f9c25623bbf
https://doi.org/10.1109/icassp49357.2023.10096786 -
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المؤلفون: Alexandre MERCAT, Jarno Vanne, Joose Sainio
المساهمون: Tampere University, Computing Sciences
المصدر: IEEE Transactions on Consumer Electronics. 68:387-400
مصطلحات موضوعية: Media Technology, Electrical and Electronic Engineering, 113 Computer and information sciences
وصف الملف: fulltext
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المؤلفون: Alexandre Mercat, Sami Ahovainio, Jarno Vanne
المساهمون: Tampere University, Computing Sciences
مصطلحات موضوعية: 113 Computer and information sciences
وصف الملف: fulltext
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6147462778a0612521f21714a8065b7c
https://trepo.tuni.fi/handle/10024/144668 -
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المؤلفون: Jaakko Laitinen, Alexandre Mercat, Jarno Vanne, Hamed Rezazadegan Tavakoli, Francesco Cricri, Emre Aksu, Miska Hannuksela
المساهمون: Tampere University, Computing Sciences
مصطلحات موضوعية: 113 Computer and information sciences
وصف الملف: fulltext
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::94b7fc1d43ad8b69762d5bd8b83cc8a1
https://trepo.tuni.fi/handle/10024/143156 -
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المؤلفون: Arttu Makinen, Jarno Vanne, Alexandre Mercat, Ari Lemmetti, Marko Viitanen, Joose Sainio
المساهمون: Tampere University, Computing Sciences
المصدر: IEEE Access, Vol 9, Pp 67813-67828 (2021)
مصطلحات موضوعية: General Computer Science, Computer science, 02 engineering and technology, 0202 electrical engineering, electronic engineering, information engineering, Codec, Overhead (computing), rate-distortion-complexity (RDC), General Materials Science, Electrical and Electronic Engineering, Xeon, General Engineering, 113 Computer and information sciences, Coding gain, HEVC test model (HM), TK1-9971, Computer engineering, objective quality analysis, Common test conditions (CTC), Algorithmic efficiency, 020201 artificial intelligence & image processing, performance profiling, Electrical engineering. Electronics. Nuclear engineering, high efficiency video coding (HEVC), Encoder, Decoding methods, Coding (social sciences)
وصف الملف: fulltext
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المؤلفون: Alexandre MERCAT, Ari Lemmetti, Marko Viitanen, Jarno Vanne, Joose Sainio
المساهمون: Tampere University, Computing Sciences
مصطلحات موضوعية: Media Technology, Electrical and Electronic Engineering, 113 Computer and information sciences
وصف الملف: fulltext
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aab90e4b54feadfefd1aae028d304758
https://trepo.tuni.fi/handle/10024/138428 -
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المؤلفون: Justine Bonnot, Alexandre Mercat, Erwan Nogues, Daniel Ménard
المصدر: Approximate Computing Techniques ISBN: 9783030947040
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7c141ed6a3c8889046306a15c2b9cd15
https://doi.org/10.1007/978-3-030-94705-7_5 -
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المؤلفون: Joni Rasanen, Aaro Altonen, Alexandre Mercat, Jarno Vanne
المساهمون: Tampere University, Computing Sciences
المصدر: 2021 IEEE International Symposium on Multimedia (ISM).
مصطلحات موضوعية: 113 Computer and information sciences
وصف الملف: fulltext
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f1a4ab78f75675701865b01aed1e65d0
https://doi.org/10.1109/ism52913.2021.00023 -
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المؤلفون: Alexandre Mercat, Jarno Vanne, Joose Sainio
المساهمون: Tampere University, Computing Sciences
المصدر: Proceedings of the 12th ACM Multimedia Systems Conference.
مصطلحات موضوعية: Software, Computer architecture, business.industry, Computer science, Encoding (memory), Benchmarking, Modular design, 113 Computer and information sciences, Bitstream, business, Conformance testing, Encoder, Automation
وصف الملف: fulltext
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3aa8b87b51bff96097a5efc415d46a83
https://doi.org/10.1145/3458305.3478445