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1مؤتمر
المؤلفون: Alswayed, Asmaa S., Alhichri, Haikel S., Bazi, Yakoub
المصدر: 2020 3rd International Conference on Computer Applications & Information Security (ICCAIS) Computer Applications & Information Security (ICCAIS), 2020 3rd International Conference on. :1-4 Mar, 2020
Relation: 2020 3rd International Conference on Computer Applications & Information Security (ICCAIS)
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2مؤتمر
المؤلفون: Alajaji, Dalal, Alhichri, Haikel S., Ammour, Nassim, Alajlan, Naif
المصدر: 2020 Mediterranean and Middle-East Geoscience and Remote Sensing Symposium (M2GARSS) Geoscience and Remote Sensing Symposium (M2GARSS), 2020 Mediterranean and Middle-East. :81-84 Mar, 2020
Relation: 2020 Mediterranean and Middle-East Geoscience and Remote Sensing Symposium (M2GARSS)
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3مؤتمر
المؤلفون: Kharshid, Areej, Alhichri, Haikel S., Ouni, Ridha, Bazi, Yakoub
المصدر: 2019 2nd International Conference on new Trends in Computing Sciences (ICTCS) Trends in Computing Sciences (ICTCS), 2019 2nd International Conference on new. :1-6 Oct, 2019
Relation: 2019 2nd International Conference on new Trends in Computing Sciences (ICTCS)
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4مؤتمر
المصدر: 2019 International Conference on Computer and Information Sciences (ICCIS) Computer and Information Sciences (ICCIS), 2019 International Conference on. :1-5 Apr, 2019
Relation: 2019 International Conference on Computer and Information Sciences (ICCIS)
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5دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
6دورية أكاديمية
المؤلفون: ABBADENI, NOUREDDINE, ALHICHRI, HAIKEL S., ELMASRY, ALAA B.
المصدر: International Journal of Image & Graphics; Jan2011, Vol. 11 Issue 1, p43-64, 22p
مصطلحات موضوعية: MATHEMATICAL symmetry, CONTENT-based image retrieval, QUERYING (Computer science), ALGORITHMS, PROTOTYPES, COMPUTER vision, IMAGE analysis
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7دورية أكاديمية
المؤلفون: Alhichri, Haikel S., Kamel, Mohamed
المصدر: International Journal of Image & Graphics; Apr2004, Vol. 4 Issue 2, p281-299, 19p
مصطلحات موضوعية: COMPUTER science, SYSTEMS design, PATTERN recognition systems, MEASURE theory, HAUSDORFF measures, MATHEMATICAL complexes, OPTICAL pattern recognition, ELECTRICAL engineering