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المؤلفون: Allesandra Fudoli, Giuseppe Martino, Paolo Aliberti, Morgan Cason, D. Gallo, A. Scrofani
المصدر: Microelectronics Reliability. 55:1579-1584
مصطلحات موضوعية: Frequency synthesizer, Engineering, business.industry, Bipolar junction transistor, Electrical engineering, Condensed Matter Physics, Fault (power engineering), Atomic and Molecular Physics, and Optics, Fault detection and isolation, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Amplitude, Electronic engineering, Radio frequency, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Failure mode and effects analysis, Voltage
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المؤلفون: Martin Igarashi, Allesandra Fudoli, Jesse Alton, V. Goubier, G. Gibbons, Morgan Cason, Antoine Reverdy, Alberto Pagani, M. Marchetti
المصدر: Microelectronics Reliability. 54:2075-2080
مصطلحات موضوعية: Resistive touchscreen, Engineering, business.industry, Terahertz radiation, Bandwidth (signal processing), Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Time-domain reflectometry, Optics, Device under test, Time domain, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Reflectometry, business, Jitter