المؤلفون: Martin Bendix Fogsgaard, Yi Zhang, Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg

المصدر: e-Prime: Advances in Electrical Engineering, Electronics and Energy, Vol 5, Iss , Pp 100205- (2023)

مصطلحات موضوعية: Reliability, Power electronics, PV Converters, Reliability prediction, Degradation feedback, Degradation based end-of-life, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2772671123001006; https://doaj.org/toc/2772-6711

URL الوصول: https://doaj.org/article/c70a8a21f9034143be62283b7960ca2c

المؤلفون: Qiang Wang, Jingwei Zhang, Francesco Iannuzzo, Amir Sajjad Bahman, Weifeng Zhang, Fengyou He

المصدر: IEEE Access, Vol 10, Pp 35605-35619 (2022)

مصطلحات موضوعية: Reliability, half-bridge IGBT module, three-level NPC topology, temperature monitoring, over-temperature protection, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9745121/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/bcf009659c6b44e6b0f52b64d5c412aa

المؤلفون: Ahmed Abuelnaga, Mehdi Narimani, Amir Sajjad Bahman

المصدر: IEEE Access, Vol 9, Pp 9643-9663 (2021)

مصطلحات موضوعية: Long-term reliability, IGBT failure modes, power cycling, lifetime models, degradation, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9316255/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/7d664cf98cf0480caee5b957a48893d1

المؤلفون: Mohsen Akbari, Mohammad Tavakoli Bina, Amir Sajjad Bahman, Bahman Eskandari, Edris Pouresmaeil, Frede Blaabjerg

المصدر: IEEE Access, Vol 9, Pp 84217-84230 (2021)

مصطلحات موضوعية: Cross-heating effect, IGBTs, layers temperature, operating conditions, solder fatigue, thermal impedance model, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9439476/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/7f4134f7d63441869051d44b4f0d4c16

المؤلفون: Tomas Lledo-Ponsati, Amir Sajjad Bahman, Francesco Iannuzzo, Daniel Montesinos-Miracle, Samuel Galceran-Arellano

المصدر: IEEE Access, Vol 9, Pp 162660-162670 (2021)

مصطلحات موضوعية: Reliability, silicon carbide, MOSFETs, harmonic distortion, current imbalances, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9638446/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/e995bc0b21804616a4d50c6bd469488d

المؤلفون: Ali Yahyaee, Amir Sajjad Bahman, Klaus Olesen, Henrik Sørensen

المصدر: Nanomaterials, Vol 12, Iss 13, p 2228 (2022)

مصطلحات موضوعية: thermal phase change, nanofluids, interface curvature, level-set, volume of fluid, benchmark study, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2079-4991/12/13/2228; https://doaj.org/toc/2079-4991

URL الوصول: https://doaj.org/article/8dabe281d777462c87ca2d43e408d8ab

المؤلفون: Ali Yahyaee, Amir Sajjad Bahman, Henrik Sørensen

المصدر: Nanomaterials, Vol 12, Iss 10, p 1665 (2022)

مصطلحات موضوعية: thermally–driven phase change, nanofluids, spurious currents, curvature calculation, volume of fluid, isoAdvection, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2079-4991/12/10/1665; https://doaj.org/toc/2079-4991

URL الوصول: https://doaj.org/article/3cae46143da34ad9bf227f802c78529f

المؤلفون: Ali Yahyaee, Amir Sajjad Bahman, Frede Blaabjerg

المصدر: Applied Sciences, Vol 10, Iss 3, p 1112 (2020)

مصطلحات موضوعية: curvy fins, heatsink, numerical simulation, offset strip fin, thermal management, u-turn, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/10/3/1112; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/3ca13a267c594d038d5eda3cc6bdfa3c

المؤلفون: Tohid Rahimi, Hossein Khoun Jahan, Frede Blaabjerg, Amir Sajjad Bahman, Seyed Hossein Hosseini

المصدر: Applied Sciences, Vol 9, Iss 1, p 88 (2018)

مصطلحات موضوعية: reliability, interleaved dc-dc converters, Markov model, MTTF, fuzzy logic, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: http://www.mdpi.com/2076-3417/9/1/88; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/fa52f3ea9fad4cf6bb094f56d698e388

المؤلفون: Huai Wang, Francesco Iannuzzo, Amir Sajjad Bahman, Kaichen Zhang, Peng Xue, Yi Zhang, Bo Yao, Zhan Shen, Ariya Sangwongwanich, Ionut Vernica, Yubo Song, Subham Sahoo, Frede Blaabjerg

المصدر: Wang, H, Iannuzzo, F, Bahman, A S, Zhang, K, Xue, P, Zhang, Y, Yao, B, Shen, Z, Sangwongwanich, A, Vernica, I, Song, Y, Sahoo, S & Blaabjerg, F 2022, ' Application-Oriented Reliability Testing of Power Electronic Components and Converters ', IEEE Power Electronics Magazine, vol. 9, no. 4, pp. 22-31 . https://doi.org/10.1109/mpel.2022.3218244
Wang, H, Iannuzzo, F, Bahman, A S, Zhang, K, Xue, P, Zhang, Y, Yao, B, Shen, Z, Sangwongwanich, A, Vernica, I, Song, Y, Sahoo, S & Blaabjerg, F 2022, ' Application-Oriented Reliability Testing of Power Electronic Components and Converters ', IEEE Power Electronics Magazine, vol. 9, no. 4, 10014625, pp. 22-31 . https://doi.org/10.1109/mpel.2022.3218244

مصطلحات موضوعية: Semiconductor device measurement, Failure analysis, Loss measurement, Control and Systems Engineering, Power electronics, Testing, Uncertainty, Energy management, Energy Engineering and Power Technology, Power system reliability, Power measurement, Converters, Electrical and Electronic Engineering

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::17865474105b7d711311654090220e04
https://doi.org/10.1109/mpel.2022.3218244