المؤلفون: Tominaga, T., Iwamatsu, T., Nakao, Y., Amishiro, H., Watanabe, H., Tomohisa, S., Miura, N., Nakata, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(1):285-290 Jan, 2022

المؤلفون: Noguchi, M., Iwamatsu, T., Amishiro, H., Watanabe, H., Miura, N., Kita, K.

المصدر: 2019 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) Electron Devices, Kansai (IMFEDK), 2019 IEEE International Meeting for Future of. :57-62 Nov, 2019

Relation: 2019 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

المؤلفون: Noguchi, M., Koyama, A., Iwamatsu, T., Amishiro, H., Watanabe, H., Miura, N.

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :23.4.1-23.4.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Noguchi, M., Iwamatsu, T., Amishiro, H., Watanabe, H., Kita, K., Miura, N.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :20.4.1-20.4.1 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Noguchi, M., Iwamatsu, T., Amishiro, H., Watanabe, H., Kita, K., Miura, N.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :8.3.1-8.3.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Noguchi, M., Iwamatsu, T., Amishiro, H., Watanabe, H., Kita, K., Yamakawa, S.

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :9.3.1-9.3.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Igarashi, M., Harada, A., Amishiro, H., Kawashima, H., Morimoto, N., Kusumi, Y., Saito, T., Ohsaki, A., Mori, T., Fukada, T., Toyoda, Y., Higashitani, K., Arima, H.

المصدر: International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :829-832 1998

Relation: International Electron Devices Meeting 1998. Technical Digest

المؤلفون: Yamaguchi, K., Amishiro, H., Yamawaki, M., Asai, S.

المصدر: ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) Microelectronic test structures Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on. :123-126 1998

Relation: ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures

المؤلفون: Yazawa, M., Hosotani, S., Imamura, Y., Amishiro, H., Okada, K.

المصدر: Proceedings of the IEEE 1995 Custom Integrated Circuits Conference Custom integrated circuits Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995. :159-162 1995

Relation: Proceedings of the IEEE 1995 Custom Integrated Circuits Conference

المؤلفون: Kohno, H., Nakamura, Y., Kondo, A., Amishiro, H., Miki, T., Okada, K.

المصدر: Proceedings of the IEEE 1995 Custom Integrated Circuits Conference Custom integrated circuits Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995. :211-214 1995

Relation: Proceedings of the IEEE 1995 Custom Integrated Circuits Conference