المؤلفون: Simicic, M., Morrison, S., Parvais, B., Weckx, P., Kaczer, B., Sawada, K., Ammo, H., Yamakawa, S., Nomoto, K., Ohno, M., Linten, D., Verkest, D., Wambacq, P., Groeseneken, G., Gielen, G.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T132-T133 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Mizumura, A., Ohishi, T., Yokoyama, N., Nonaka, M., Tanaka, S., Ammo, H.

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :39-42 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

المؤلفون: Weckx, P., Simicic, M., Nomoto, K., Ono, M., Parvais, B., Kaczer, B., Raghavan, P., Linten, D., Sawada, K., Ammo, H., Yamakawa, S., Spessot, A, Verkest, D., Mocuta, Anda

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :CR-7.1-CR-7.6 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Ammo, H., Ejiri, H., Kanematsu, S., Kikuchi, H., Yano, M., Miwa, H.

المصدر: 29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:444-447 1999

Relation: 29th European Solid-State Device Research Conference

المؤلفون: Miwa, H., Ammo, H., Ejiri, H., Kanematsu, S., Gomi, T.

المصدر: Proceedings of the 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 1996., Proceedings of the 1996. :185-188 1996

Relation: Proceedings of the 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting

المؤلفون: Mizumura, A., Oishi, T., Yokoyama, N., Nonaka, M., Tanaka, S., Ammo, H.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 19(1):19-26 Feb, 2006

المؤلفون: Mizumura, A., Suzuki, T., Arima, T., Maeda, H., Ammo, H.

المصدر: 2008 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on. :8-10 Mar, 2008

Relation: 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS)

المؤلفون: Nakamura, A., Yoshikawa, N., Miyazako, T., Oishi, T., Ammo, H., Takeshita, K.

المصدر: IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 Radio Frequency Integrated Circuits Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 IEEE. :4 pp. 2006

Relation: 2006 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium

المؤلفون: Koot, Bart G. P., van der Baan-Slootweg, Olga H., Tamminga-Smeulders, Christine L. J., els Rijcken, T. ammo H. P., Korevaar, Joke C., van Aalderen, Wim M, Jansen, Peter L. M., Benninga, Marc A.

المصدر: Archives of Disease in Childhood; Jul2011, Vol. 96 Issue 7, p669-674, 6p, 4 Charts, 1 Graph

مصطلحات موضوعية: HEALTH care intervention (Social services), FATTY liver, THERAPEUTICS, LONGITUDINAL method, COHORT analysis, CHILDHOOD obesity, DIAGNOSTIC ultrasonic imaging, INSULIN resistance

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