المؤلفون: J.-R. Vaille, Andre Touboul, Frédéric Saigné, S. Bourdarie, A. Privat, G. Chaumont, A. Michez, Richard Arinero, Frédéric Wrobel, N. Chatry, Eric Lorfevre

المساهمون: Service Geologique de la Nouvelle-Calédonie, Direction de l'Industrie, des Mines et de l'Energie, Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), ONERA - The French Aerospace Lab [Toulouse], ONERA, TRAD [Labège], TRAD, STMicroelectronics, Centre National d'Études Spatiales [Toulouse] (CNES)

المصدر: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (6), pp.4166-4174. ⟨10.1109/TNS.2013.2287974⟩

مصطلحات موضوعية: 010302 applied physics, Nuclear and High Energy Physics, Materials science, 010308 nuclear & particles physics, business.industry, 01 natural sciences, Heavy ion irradiation, [SPI.TRON]Engineering Sciences [physics]/Electronics, Stress (mechanics), Reliability (semiconductor), Nuclear Energy and Engineering, 13. Climate action, 0103 physical sciences, Electronic engineering, Optoelectronics, Degradation (geology), Heavy ion, Irradiation, Electrical and Electronic Engineering, Power MOSFET, business, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::17319218fcb7a5f5fd2baf465a4c9922
https://doi.org/10.1109/tns.2013.2287974

المؤلفون: L. L. Foro, Andre Touboul, Frédéric Wrobel, F. Saigne

المساهمون: Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (6), pp.2748-2754. ⟨10.1109/TNS.2011.2172631⟩

مصطلحات موضوعية: 010302 applied physics, Nuclear and High Energy Physics, Critical charge, Engineering, 010308 nuclear & particles physics, business.industry, Nuclear engineering, Monte Carlo method, Insulated-gate bipolar transistor, Neutron radiation, 01 natural sciences, [SPI.TRON]Engineering Sciences [physics]/Electronics, Nuclear Energy and Engineering, Logic gate, 0103 physical sciences, Trench, Electronic engineering, Neutron, Sensitivity (control systems), Electrical and Electronic Engineering, business, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::047353fbf79ac9a81e70d9ee8cc82b24
https://doi.org/10.1109/tns.2011.2172631

المؤلفون: Frédéric Wrobel, M. Portier, Ronald D. Schrimpf, M. Gedion, Andre Touboul, F. Saigne

المساهمون: Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Kastler Brossel (LKB (Lhomond)), Université Pierre et Marie Curie - Paris 6 (UPMC)-Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS), École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-Centre National de la Recherche Scientifique (CNRS), Vanderbilt University [Nashville], Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS), École normale supérieure - Paris (ENS-PSL), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS-PSL), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (6), pp.2793-2797. ⟨10.1109/TNS.2011.2172954⟩
IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2793-2797. ⟨10.1109/TNS.2011.2172954⟩

مصطلحات موضوعية: 010302 applied physics, Nuclear and High Energy Physics, Radionuclide, Materials science, Isotope, Physics::Instrumentation and Detectors, 010308 nuclear & particles physics, Physics::Medical Physics, Alpha particle, Secular equilibrium, 01 natural sciences, humanities, [SPI.TRON]Engineering Sciences [physics]/Electronics, Physics::Geophysics, Nuclear physics, Nuclear Energy and Engineering, 0103 physical sciences, Physics::Accelerator Physics, Nuclide, Decay chain, Electrical and Electronic Engineering, Nuclear Experiment, Disintegration Rate, ComputingMilieux_MISCELLANEOUS, Radioactive decay

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::965c41306c694c992de7b0dda20aeabf
https://doi.org/10.1109/tns.2011.2172954

المؤلفون: Philippe Cocquerez, B. Azais, Andre Touboul, Luigi Dilillo, J.L. Autran, M Lacourty, P Rech, C. Chatry, Frédéric Wrobel, Pierre Chadoutaud, Thien Lam-Trong, J.-R. Vaille, F. Saigne, Jean-Marc Galliere, F Laplanche, Denis Pantel

المصدر: IEEE Transactions on Nuclear Science. 58:945-951

مصطلحات موضوعية: 010302 applied physics, Physics, Nuclear and High Energy Physics, Silicon, 010308 nuclear & particles physics, Detector, chemistry.chemical_element, Cosmic ray, Atmospheric model, Atmospheric sciences, Balloon, 01 natural sciences, Altitude, Nuclear Energy and Engineering, chemistry, Ionization, 0103 physical sciences, Neutron, Electrical and Electronic Engineering, Physics::Atmospheric and Oceanic Physics, Remote sensing

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::60814d777be9401fc716297cdd78a4a1
https://doi.org/10.1109/tns.2011.2136359

المؤلفون: Andre Touboul, Gaudenzio Meneghesso, Anna Cavallini, Nathalie Labat, Mustapha Faqir, F. Danesin, Giovanni Verzellesi, Fausto Fantini, Enrico Zanoni, Antonio Castaldini, Fabiana Rampazzo, Christian Dua

المساهمون: M. Faqira, G. Verzellesi, F. Fantini, F. Danesin, F. Rampazzo, G. Meneghesso, E. Zanoni, A. Cavallini, A. Castaldini, N. Labat, A. Touboul, C. Dua

المصدر: Microelectronics Reliability. 47:1639-1642

مصطلحات موضوعية: Materials science, DEEP LEVELS, Gallium nitride, Algan gan, High-electron-mobility transistor, Trap (computing), chemistry.chemical_compound, Reliability (semiconductor), Electronic engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, HEMT, Computer simulation, business.industry, TRAPS, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Characterization (materials science), Gallium Nitride, Charge Trapping, chemistry, numerical simulation, Optoelectronics, NITRIDES, business, Degradation (telecommunications)

وصف الملف: ELETTRONICO

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::068de8f96c6755c1db67d471ea30433a
https://doi.org/10.1016/j.microrel.2007.07.005

المؤلفون: Christian Dua, Alberto Sozza, Nathalie Labat, Arnaud Curutchet, Nathalie Malbert, Andre Touboul

المصدر: Microelectronics Reliability. 46:1725-1730

مصطلحات موضوعية: Engineering, business.industry, Infrasound, Transistor, Biasing, High-electron-mobility transistor, Condensed Matter Physics, Noise (electronics), Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), Reliability (semiconductor), law, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::81073e55030d5e1bb9d29b12d44da8dd
https://doi.org/10.1016/j.microrel.2006.07.062

المؤلفون: Nathalie Malbert, Andre Touboul, J.L. Muraro, Naoufel Ismail, Nathalie Labat

المصدر: physica status solidi c. 3:499-503

مصطلحات موضوعية: Materials science, business.industry, Amplifier, Transistor, High-electron-mobility transistor, Condensed Matter Physics, law.invention, Power (physics), law, Optoelectronics, Breakdown voltage, MESFET, State (computer science), business, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5ad1d6f07152b9466e63262ba1802860
https://doi.org/10.1002/pssc.200564168

المؤلفون: Philippe Perdu, Vincent Pouget, Nicolas Guitard, Andre Touboul, David Trémouilles, Dean Lewis, Nicolas Nolhier, F. Essely, Marise Bafleur

المصدر: Microelectronics Reliability. 45:1415-1420

مصطلحات موضوعية: Engineering, business.industry, Electronic engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Condensed Matter Physics, business, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bd2ca853dd2a9928753f0616055a9c03
https://doi.org/10.1016/j.microrel.2005.07.030

المؤلفون: Mohamed Belhaj, Brice Grandchamp, Nathalie Labat, Cristell Maneux, Andre Touboul

المصدر: Solid-State Electronics. 49:956-964

مصطلحات موضوعية: business.industry, Band gap, Heterojunction bipolar transistor, Direct current, Electrical engineering, Binary compound, Carrier lifetime, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Ternary compound, Materials Chemistry, Indium phosphide, Optoelectronics, Electrical and Electronic Engineering, business, Current density

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0659da8c053338af693dbcf63db36aa2
https://doi.org/10.1016/j.sse.2005.03.007

المؤلفون: A. Minko, Christophe Gaquiere, Nathalie Labat, Nathalie Malbert, Arnaud Curutchet, Andre Touboul

المصدر: Fluctuation and Noise Letters. :L319-L328

مصطلحات موضوعية: Materials science, Silicon, business.industry, General Mathematics, Transistor, General Physics and Astronomy, chemistry.chemical_element, Gallium nitride, Substrate (electronics), High-electron-mobility transistor, Low frequency, Noise (electronics), law.invention, chemistry.chemical_compound, chemistry, law, Optoelectronics, Flicker noise, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9061ae55034c10a0ea4ab758c928fcca
https://doi.org/10.1142/s0219477504001926