يعرض 1 - 10 نتائج من 227 نتيجة بحث عن '"Andrei, Petru"', وقت الاستعلام: 0.95s تنقيح النتائج
  1. 1
    مؤتمر
    Transport Model for Magnetic Particles in Aqueous Solutions

    المؤلفون: Andrei, Petru, Carlstedt, Nicholas

    المصدر: 2024 IEEE International Magnetic Conference - Short papers (INTERMAG Short papers) Magnetic Conference - Short papers (INTERMAG Short papers), 2024 IEEE International. :1-2 May, 2024

    Relation: 2024 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers)

    أضف إلى المفضلة
  2. 2
    مؤتمر
    The International Magnetics Conference (INTERMAG) 2023 Preface

    المؤلفون: Bohn, Felipe, Hsieh, Min-Fu, Lee, Kyung-Jin, Rea, Chris, Spiesser, Aurelie, Andrei, Petru

    المصدر: 2023 IEEE International Magnetic Conference (INTERMAG) Magnetic Conference (INTERMAG), 2023 IEEE International. :1-1 May, 2023

    Relation: 2023 IEEE International Magnetic Conference (INTERMAG)

    Full Text Finder
    أضف إلى المفضلة
  3. 3
    مؤتمر
    The Performances of the Fixed Constraints Transform Applied in Text Compression Experimental Results and Comparisons

    المؤلفون: Radescu, Radu, Barar, Andrei Petru

    المصدر: 2018 10th International Conference on Electronics, Computers and Artificial Intelligence (ECAI) Electronics, Computers and Artificial Intelligence (ECAI), 2018 10th International Conference on. :1-6 Jun, 2018

    Relation: 2018 10th International Conference on Electronics, Computers and Artificial Intelligence (ECAI)

    أضف إلى المفضلة
  4. 4
    مؤتمر
    Simulation of the Frequency Comb Induced by a Periodically Excited Tunnel Junction in Silicon

    المؤلفون: Zhu, Chen, Andrei, Petru, Hagmann, Mark

    المصدر: 2017 IEEE Workshop on Microelectronics and Electron Devices (WMED) Microelectronics and Electron Devices (WMED), 2017 IEEE Workshop on. :1-4 Apr, 2017

    Relation: 2017 IEEE Workshop on Microelectronics and Electron Devices (WMED)

    Full Text Finder
    أضف إلى المفضلة
  5. 5
    مؤتمر
    Towards “atomistic” dopant profiling using SCM measurements

    المؤلفون: Aghaei, Samira, Andrei, Petru, Hagmann, Mark

    المصدر: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2015 International Conference on. :401-404 Sep, 2015

    Relation: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

    Full Text Finder
    أضف إلى المفضلة
  6. 6
    مؤتمر
    "Atomistic" Dopant Profiling Using Scanning Capacitance Microscopy

    المؤلفون: Aghaei, Samira, Andrei, Petru, Hagmann, Mark

    المصدر: 2015 IEEE Workshop on Microelectronics and Electron Devices (WMED) Microelectronics and Electron Devices (WMED), 2015 IEEE Workshop on. :1-5 Mar, 2015

    Relation: 2015 IEEE Workshop on Microelectronics and Electron Devices (WMED)

    Full Text Finder
    أضف إلى المفضلة
  7. 7
    مؤتمر
    Challenges and opportunities in atomistic dopant profiling using capacitance-voltage measurements

    المؤلفون: Aghaei, Samira, Hehta, Mohit, Andrei, Petru, Hagmann, Mark J.

    المصدر: 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) Advanced Semiconductor Manufacturing Conference (ASMC), 2014 25th Annual SEMI. :130-135 May, 2014

    Relation: 2014 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  8. 8
    مؤتمر
    Scanning frequency comb microscopy (SFCM): A new method showing promise for high-resolution carrier profiling in semiconductors

    المؤلفون: Hagmann, Mark J., Andrei, Petru, Pandey, Shashank, Nahata, Ajay

    المصدر: 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) Advanced Semiconductor Manufacturing Conference (ASMC), 2014 25th Annual SEMI. :213-218 May, 2014

    Relation: 2014 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  9. 9
    مؤتمر
    Scanning frequency comb microscopy (SFCM) shows promise for sub-10 nm dopant profiling

    المؤلفون: Hagmann, Mark J., Andrei, Petru

    المصدر: 2014 IEEE Workshop On Microelectronics And Electron Devices (WMED) Microelectronics And Electron Devices (WMED), 2014 IEEE Workshop On. :1-4 Apr, 2014

    Relation: 2014 IEEE Workshop On Microelectronics And Electron Devices (WMED)

    Full Text Finder
    أضف إلى المفضلة
  10. 10
    مؤتمر
    Simulations of “atomistic” effects in nanoscale dopant profiling

    المؤلفون: Andrei, Petru, Mehta, Mohit, Hagmann, Mark J.

    المصدر: ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI. :194-199 May, 2013

    Relation: 2013 24th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
أدوات البحث: أحصل على تغذية RSS – أرسل هذا البحث بالبريد الإلكتروني – حفظ البحث – جدول التنبيهات: لا شيء